5G/6G IoT: Smart RF Link Integrated Circuit System Design

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Circuit and Signal Processing".

Deadline for manuscript submissions: closed (30 June 2021) | Viewed by 3852

Special Issue Editor


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Guest Editor
College of Engineering, Inha University, Incheon 22212, Korea
Interests: RF/Analog IC design for energy-efficient wireless/wireline communication; RF/THz electronics for sensing/imaging; biomedical applications

Special Issue Information

Dear Colleagues,

5G/6G heterogeneous computing and communication systems will be one of the most important technologies for autonomous vehicles and smart mobility systems. To enable those systems, innovative 5G/6G RF IC and system-on-chip (SoC), and application-specific integrated circuits (ASIC) designs will be needed to improve far beyond mobile communication links by high-performance RF integrated transceivers, transmitters, and receivers design.

This Special Issue focuses on the analysis, design, and implementation of RF/analog integrated circuit design for energy-efficient wireless/wireline communication, RF/THz electronics for sensing/imaging, biomedical applications, etc.

Prof. Dr. Gyung-Su Byun
Guest Editor

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Keywords

  • 5G/6G heterogeneous computing and communication system
  • High-performance RF integrated transceivers
  • High-performance transmitters and receivers
  • Analog integrated circuit design for wireless/wireline communication
  • RF/THz electronics for sensing/imaging
  • biomedical applications.

Published Papers (1 paper)

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Research

13 pages, 9496 KiB  
Article
A Sub-THz Wireless Power Transfer for Non-Contact Wafer-Level Testing
by Hanh Dang-ba and Gyung-su Byun
Electronics 2020, 9(8), 1210; https://doi.org/10.3390/electronics9081210 - 28 Jul 2020
Cited by 2 | Viewed by 3151
Abstract
In this paper, a sub-THz wireless power transfer (WPT) interface for non-contact wafer-level testing is proposed. The on-chip sub-THz couplers, which have been designed and analyzed with 3-D EM simulations, could be integrated into the WPT to transfer power through an air media. [...] Read more.
In this paper, a sub-THz wireless power transfer (WPT) interface for non-contact wafer-level testing is proposed. The on-chip sub-THz couplers, which have been designed and analyzed with 3-D EM simulations, could be integrated into the WPT to transfer power through an air media. By using the sub-THz coils, the WPT occupies an extremely small chip size, which is suitable for future wafer-testing applications. In the best power transfer efficiency (PTE) condition of the WPT, the maximum power delivery is limited to 2.5 mW per channel. However, multi-channel sub-THz WPT could be a good solution to provide enough power for testing purposes while remaining high PTE. Simulated on a standard 28-nm CMOS technology, the proposed eight-channel WPT could provide 20 mW power with the PTE of 16%. The layouts of the eight-channel WPT transmitter and receiver occupy only 0.12 mm2, 0.098 mm2, respectively. Full article
(This article belongs to the Special Issue 5G/6G IoT: Smart RF Link Integrated Circuit System Design)
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