Sampaio da Silva, C.; Beyer, C.; Boos, J.; Kumar, S.; Modena, M.; Valentin, T.; Hierlemann, A.; Revol, V.
Sensitivity Characterization of an Impedance-Based Platform for Viability Analysis of 3D Spheroids. Proceedings 2024, 97, 132.
https://doi.org/10.3390/proceedings2024097132
AMA Style
Sampaio da Silva C, Beyer C, Boos J, Kumar S, Modena M, Valentin T, Hierlemann A, Revol V.
Sensitivity Characterization of an Impedance-Based Platform for Viability Analysis of 3D Spheroids. Proceedings. 2024; 97(1):132.
https://doi.org/10.3390/proceedings2024097132
Chicago/Turabian Style
Sampaio da Silva, Claudia, Christian Beyer, Julia Boos, Sreedhar Kumar, Mario Modena, Thomas Valentin, Andreas Hierlemann, and Vincent Revol.
2024. "Sensitivity Characterization of an Impedance-Based Platform for Viability Analysis of 3D Spheroids" Proceedings 97, no. 1: 132.
https://doi.org/10.3390/proceedings2024097132
APA Style
Sampaio da Silva, C., Beyer, C., Boos, J., Kumar, S., Modena, M., Valentin, T., Hierlemann, A., & Revol, V.
(2024). Sensitivity Characterization of an Impedance-Based Platform for Viability Analysis of 3D Spheroids. Proceedings, 97(1), 132.
https://doi.org/10.3390/proceedings2024097132
