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Journal: Processes, 2025
Volume: 13
Number: 316
Article:
An Improved Mask2Former-HRNet Method for Insulator Defect Detection
Authors:
by
Yaoran Huo, Lan Xiao, Zhenyu Tang, Jian Zhou, Xu Dai, Yuhao Xiao and Xia Fang
Link:
https://www.mdpi.com/2227-9717/13/2/316
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