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Journal: Mathematics, 2021
Volume: 9
Number: 2734
Article:
One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories
Authors:
by
Christian Acal, Juan E. Ruiz-Castro, David Maldonado and Juan B. Roldán
Link:
https://www.mdpi.com/2227-7390/9/21/2734
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