Correction: Polymeropoulos et al. Enhancing Solar Plant Efficiency: A Review of Vision-Based Monitoring and Fault Detection Techniques. Technologies 2024, 12, 175

The authors wish to make the following corrections to this paper [1]:

Text Correction

• Section 5: The introductory text in Section 5 has been modified to more original content.
• Section 5.1 (Sections 5.1.2–5.1.9): In order to avoid similarities with other relevant work on the same subject, these subsections have been revised, while preserving the original information.
• Section 5.2 (Sections 5.2.1–5.2.3): In order to avoid similarities with other relevant work on the same subject, these subsections have been revised, while preserving the original information.

Figure Updates

4.

Section 5.1.4: In order to pursue originality, Figures 4 and 5 were replaced with equivalent, original images.

5.

Section 5.1.5: In order to pursue originality, Figures 6 and 7 were replaced with equivalent, original images.

The corrected figures appear below.

Figure 4. (a) Indoor and (b) outdoor thermography setups [49].

Figure 4. (a) Indoor and (b) outdoor thermography setups [49].

Figure 5. Defects in IR Imaging: (a) breakage of front glass; (b) overheated cell due to internal cell problems; (c) hot spot; (d) overheating due to external shading; (e) open junction box and overheated diode; (f) overheated junction box; (g) overheating due to shading by neighboring PV module row; (h) overheated bypass diode [56]. Colors from green to red indicate cold to heat-up (defected) areas. Images serve as indicative depictions of the specified defects in IR imaging, and the letterings within them are of no significance.

Figure 5. Defects in IR Imaging: (a) breakage of front glass; (b) overheated cell due to internal cell problems; (c) hot spot; (d) overheating due to external shading; (e) open junction box and overheated diode; (f) overheated junction box; (g) overheating due to shading by neighboring PV module row; (h) overheated bypass diode [56]. Colors from green to red indicate cold to heat-up (defected) areas. Images serve as indicative depictions of the specified defects in IR imaging, and the letterings within them are of no significance.

Figure 6. EL imaging setup [11].

Figure 6. EL imaging setup [11].

Figure 7. Different types of defects in EL imaging [56]: (a) PID-s affected module; (b) crack pattern due to impacts; (c) polycrystalline PV module with cracked cells; (d) monocrystalline PV module with potential induced degradation; (e) busbar corrosion in cell; (f) cracked cell; (g) cracked cell of original orientation; (h) cracked cell of different orientation, rotated 180°; (i) cracked cell of different orientation, flipped about x-axis; (j) cracked cell of different orientation, flipped about y-axis; (k) module having undergone damp-heat exposure; (l) monocrystalline PV module with induced degradation.

Figure 7. Different types of defects in EL imaging [56]: (a) PID-s affected module; (b) crack pattern due to impacts; (c) polycrystalline PV module with cracked cells; (d) monocrystalline PV module with potential induced degradation; (e) busbar corrosion in cell; (f) cracked cell; (g) cracked cell of original orientation; (h) cracked cell of different orientation, rotated 180°; (i) cracked cell of different orientation, flipped about x-axis; (j) cracked cell of different orientation, flipped about y-axis; (k) module having undergone damp-heat exposure; (l) monocrystalline PV module with induced degradation.

The authors state that the scientific conclusions are unaffected. These corrections were approved by the Academic Editor. The original publication has also been updated.