You are currently viewing a new version of our website. To view the old version click .
Technologies
  • Review
  • Open Access

26 September 2024

Enhancing Solar Plant Efficiency: A Review of Vision-Based Monitoring and Fault Detection Techniques

,
,
and
MLV Research Group, Department of Informatics, Democritus University of Thrace, 65404 Kavala, Greece
*
Author to whom correspondence should be addressed.
This article belongs to the Special Issue Advanced Autonomous Systems and Artificial Intelligence Stage

Abstract

Over the last decades, environmental awareness has provoked scientific interest in green energy, produced, among others, from solar sources. However, for the efficient operation and longevity of green solar plants, regular inspection and maintenance are required. This work aims to review vision-based monitoring techniques for the fault detection of photovoltaic (PV) plants, i.e., solar panels. Practical implications of such systems include timely fault identification based on data-driven insights and problem resolution, resulting in enhanced energy outputs, extended lifetime spans for PV panels, cost savings, as well as safe and scalable inspections. Details regarding the main components of PV systems, operation principles and key non-destructive fault detection technologies are included. Advancements in unmanned aerial vehicles (UAVs), as well as in artificial intelligence (AI), machine learning (ML) and deep learning (DL) methods, offering enhanced monitoring opportunities, are in focus. A comparative analysis and an overall evaluation of state-of-the-art vision-based methods for detecting specific types of defects on PVs is conducted. The current performance and failures of vision-based algorithms for solar panel fault detection are identified, raising their capabilities, limitations and research gaps, towards effectively guiding future research. The results indicate that shading anomalies significantly impact the performance of PV units, while the top five fault detection methodologies, according to preset evaluation criteria, involve deep learning methods, such as CNNs and YOLO variations.

1. Introduction

Solar energy is an inexhaustible clean power source that is increasingly significant in both technological advancements and environmental sustainability. As climate changes and the depletion of traditional energy resources pose serious threats to our future, photovoltaic (PV) systems emerge as a pioneering solution. These systems harness the photovoltaic effect to convert solar radiation into electrical energy, providing a clean and limitless power source [].
The journey of PV technology began in 1839 when French physicist Edmond Becquerel discovered the photovoltaic effect. Since then, research and technological advancements have led to the development of the first PV cells, which now offer impressive performance and applications across various needs [].
PV systems are not just technical innovations; they are ecological necessities. Each kilowatt-hour of electricity produced by photovoltaic systems reduces carbon dioxide emissions, making them vital for environmental protection. Additionally, solar energy provides economic benefits, especially in sunny regions where investing in photovoltaics can result in significant savings and profits []. Therefore, it is essential that PV plants remain reliable and function effectively, referring to excellent installation, frequent maintenance, and high-quality inspections for faults. Faults may occur while manufacturing, transporting, assembling and operating PV panels. Faults need to be detected on time, so as to be repaired and prevent safety issues and energy losses.
Currently, fault detection methods have been in research focus, especially those that are not intrusive and can also provide details on the location of faults. Vision-based inspection has prevailed over other methods, due to the continuous advancements of camera technologies and graphics processing unit (GPU) architectures, as well as the progress of artificial intelligence (AI) and computer vision (CV) algorithms. The latter combination has the potential to detect, classify and localize faults, with low costs, and high reliability.
Contemporary challenges in vision-based PV fault detection systems include data overload issues due to the vast amount of produced data from various integrated sensors, creating barriers to the need for real-time fault detection. High-resolution images are needed to accurately detect faults; yet, their processing requires significant time and resources. Contemporary challenges also include the need for the improvement of fault detection accuracies by developing more advanced detection algorithms. The investigation of common faults, resulting mainly due to external environmental conditions, need to be identified so as to focus research on their effective detection.
To this end, this work aims to provide a review on AI vision-based solar panel inspection techniques, focusing on dealing with contemporary challenges. Many reviews have been recently published on the subject [,,,,,]. Yet, most of these review works focus on specific monitoring techniques and are not meant to be generic so as to cover multiple aspects of PV systems. These approaches aim to holistically summarize the key detection technologies, as well as machine learning and deep learning methodologies. The primary gaps we identified in these review works, and eventually aim to address in the proposed work, are the following:
  • The lack of study on faults in relation to the performance of photovoltaic modules.
  • The lack of evaluation of the proposed methodologies.
To this end, the contributions of this work that are not addressed cumulatively in other papers are summarized as follows:
  • Presentation of PV systems’ fundamentals.
  • Evolution of computer vision algorithms for PV fault detection within the decade.
  • Summarization of all key monitoring techniques for PV fault detection, along with individual and comparative assessment of their capabilities and limitations.
  • A focus on PV fault detection using AI-based computer vision, including machine learning and other pattern recognition methods, image processing techniques, and deep learning methods.
  • Common faults detectable by CV algorithms in PV systems and how they affect the systems’ performance.
  • Review of CV-based fault detection methodologies, cumulative performance tables and guidelines to select the appropriate one based on proposed criteria.
The rest of the paper is structured as follows. Section 2 presents the research methodology. Section 3 summarizes the fundamentals of PV systems. Section 4 presents the evolution of CV algorithms in PVs over the last decade. Capabilities and limitations of basic detection technologies are included in Section 5, focusing on fault detection using AI-based CV algorithms. Section 6 summarizes CV detected PV faults and related PV system performance. Section 7 provides an overview of CV-based PV fault detection methodologies and their evaluation. Finally, Section 8 and Section 9 discuss the research findings and conclude the paper, respectively.

2. Research Methodology

To provide a comprehensive review that manages to effectively address the identified gaps, we pose the following four research questions (RQ):
  • RQ1: How have CV algorithms evolved in the context of fault detection in photovoltaic systems over the past decade?
  • RQ2: What are the capabilities and limitations of key CV-based detection technologies concerning faults in photovoltaic systems?
  • RQ3: What are the common faults that can be detected with CV in photovoltaic systems, and which of these significantly affect system performance?
  • RQ4: What CV-based fault detection methodologies are identified in the literature, and how can the appropriate method be selected?
Figure 1 outlines the followed roadmap for addressing these four research questions. Research questions in this work are answered through a comprehensive review of identified articles relevant to the subject of interest. Figure 1 aims to illustrate the RQs and define the connection between them, as well as to indicate the exact order in which the questions are answered in the subsections entitled with the same name as each RQ, i.e., to align the RQs with specific subsections towards guiding the reader through the content logically.
Figure 1. The followed roadmap. Connection of RQs and corresponding subjections where RQs are addressed.
The research of relevant articles in this work was conducted in the Scopus database within Article title, Abstract and Keywords, by using the query: “computer vision” AND “PV” AND “faults detection” OR “defects” OR “anomalies”. The search returned 52 articles ranging from 2014–2024.
To further refine the research results, the following eligibility criteria were applied:
  • Language was limited to English.
  • Subject area was limited to Engineering and Computer Science.
  • Document types were limited to Conference papers and Articles.
By applying these limitations, 38 related documents were identified and used as sources in the following.

3. Fundamentals of PV Systems

In this section, the fundamentals of PV systems are summarized, including the main components of a PV system and PV operating principles.

3.1. Components

A PV system comprises the following main components, as illustrated in Figure 2:
Figure 2. PV system main components.
  • Photovoltaic Panels (PV Modules):
    a.
    Made up of photovoltaic cells that convert sunlight into electrical energy.
    b.
    Panels can be monocrystalline, polycrystalline or thin-film, each with unique performance characteristics and costs.
  • Inverter:
    a.
    Converts the direct current (DC) produced by the photovoltaic panels into alternating current (AC) for use by electrical appliances or the grid.
    b.
    Different types of inverters, such as half-bridge and full-bridge, have various applications and features.
  • Mounting System:
    a.
    Includes the supports and structures that hold the photovoltaic panels, either fixed or adjustable for solar tracking systems.
  • Wiring and Connections:
    a.
    Essential for connecting the photovoltaic panels to the inverter and the power grid.
    b.
    Includes DC and AC cables, as well as grounding and lightning protection systems.
  • Telemetry System:
    a.
    Ensures the monitoring and control of the photovoltaic system’s performance.
    b.
    May include wireless or wired connections for data transmission.

3.2. Operating Principles

The photovoltaic effect relies on semiconductor materials that convert solar radiation into electrical energy. When photons (packets of energy from sunlight) hit the photovoltaic cells, they excite the electrons in the semiconductor materials, causing an electric current to flow. This current is then collected and converted into usable electrical energy by the inverter.
The efficiency of a photovoltaic system depends on several factors, including the quality of materials, the intensity of solar radiation, and environmental conditions. Despite its limitations, photovoltaic technology continues to advance, offering more efficient and cost-effective solutions for generating clean energy.
In summary, photovoltaic systems represent an innovative and sustainable response to modern energy challenges, providing an environmentally friendly and economically viable solution. Continuous research and development in this field promise a bright future for solar energy and its role in creating a sustainable and clean environment.

4. Evolution of Computer Vision Algorithms in PVs over the Last Decade

This section provides a comprehensive overview of how computer vision algorithms have evolved in photovoltaic fault detection over the last decade (RQ1). Using Scopus, we explored over 60 relevant studies. Table 1 includes the findings we have traced regarding the advancements and shifts in focus in this scientific field. More specifically, for each distinct period within the decade, the focus of research, the current state-of-the-art technologies and algorithms, as well as the key developments and limitations of each period are identified and summarized in the table.
Table 1. Evolution of computer vision algorithms in PV fault detection over the last decade.
In the early 2010s, traditional image processing techniques like edge detection and segmentation dominated the field []. These methods relied heavily on rule-based techniques and manual parameter adjustments. The latter posed limitations, since manual feature extraction can be time-consuming and may fail to capture the inherent characteristics of faults, leading to poor detection accuracies especially for complex faults. As the decade progressed, machine learning started to make its mark. Algorithms such as Support Vector Machine (SVM) [] and Random Forest (RF) [] appeared, employing handcrafted features and initial feature classifiers to improve detection accuracy. The limitation of feature engineering, feature extraction and selection, was still evident, while problem complexities could not efficiently be handled. Moreover, generalization issues were reported due to the varying environmental conditions and different PV systems, making algorithms difficult to generalize well. By the late 2010s, the field experienced a significant shift with the advent of deep learning, particularly Convolutional Neural Networks (CNNs) []. These models enabled automated feature learning, leading to substantial improvements in detection accuracy and efficiency. However, data requirements were excessive. Large benchmark datasets with annotated data were needed, while the training time of algorithms and the needs for computational resources began to augment. In the early 2020s, the focus shifted towards integrating multiple modalities, using CNNs in combination with infrared (IR), visible and electroluminescence (EL) imaging [,,]. This integration resulted in enhanced fault detection capabilities under various conditions. Multiple data modalities posed many challenges, such as data overload, and data synchronization. Moreover, the need for sophisticated fusion techniques emerged. The processing of multiple data streams increased system complexity and computational burden. At the same time, the need for explainable deep learning algorithms started to show, revealing the research gap of interpretability of multimodal deep models. Currently, the trend is moving towards real-time detection and adaptability []. Advanced models like CNNs and YOLO are being employed for on-site processing, enabling real-time detection and adaptability to varying environmental conditions []. Interpretable AI algorithms, adaptability to new faults, and robustness to environmental changes were, therefore, in focus. Limitations included costs and scalability, since the size of PV installations tend to increase, producing vast amount of data and needing significant computational power.
Looking ahead, the future direction of research in this field is expected to focus on scalability and economic viability. Researchers are working on developing scalable deep learning models that can be economically viable and provide comprehensive fault detection solutions. A foreseen challenge is that of cybersecurity, since AI systems may be vulnerable to cyber and adversarial attacks, requiring robust AI models and secure communication protocols and encryption techniques to protect algorithms and data integrity.
Subsequently, by analyzing the content of the studied papers, and by using the functionalities of Scopus, Figure 3 was derived. Figure 3 depicts the key developments and research efforts, in terms of published works, over the past decade regarding the use of computer vision algorithms for detecting faults, defects and anomalies in PV systems, along with the key technological developments that marked the decade. The research was conducted within Article title, Abstract and Keywords, by using the query: “computer vision” AND “PV” AND “faults detection” OR “defects” OR “anomalies”. The search returned 52 articles ranging from 2014–2024. It is clear that the introduction of CNNs in PV fault detection in the late 2010s has brought a significant increase in the number of related documents, resulting an upward trend in the following years.
Figure 3. Evolution of trends and the corresponding number of papers on computer vision algorithms for PV fault detection according to Scopus, on the same reference timeline from 2014 to 2024.

5. Capabilities and Limitations of Basic Detection Technologies

Faults and failures in PV modules can be detected with many methods, including UAV-based or visual inspections, I-V curve and electromagnetic induction measurements, infrared thermography, electroluminescence and photoluminescence imaging, ultraviolet fluorescence methods, and spectroscopy. In what follows, the key fault detection technologies for PV systems are reviewed, reporting their capabilities and limitations. Moreover, extended research in CV based fault detection technologies is conducted (RQ2).

5.1. Key Fault Detection Technologies for PV Systems

5.1.1. UAV-Based Inspection

The effectiveness of basic detection technologies has been tested in several preliminary laboratory experiments. These promising results have encouraged researchers to explore using these inspection techniques for large photovoltaic installations. The solution identified by field experts, which has become a standard in recent years, involves using specialized unmanned aerial vehicles (UAVs), such as drones, equipped with cameras for fault detection []. This method has two main advantages: (1) it is suitable for inspecting large photovoltaic fields as the entire installation can be surveyed in a few flights (depending on the size of the installation and the UAV’s battery life), and (2) it significantly reduces the cost and time required for analysis compared to traditional inspection techniques. The suitability of this solution has been evaluated through qualitative analysis in real photovoltaic fields to verify which anomalies are visible with moving cameras and to determine the impact of flight parameters on detection capabilities, thus testing the reliability of specialized UAVs [,,,,,].
Specifically, two types of architectures for anomaly detection can be identified: (1) real-time image analysis of photovoltaic modules during the UAV flight, and (2) offline image analysis, examining the video recorded during the inspection. Naturally, the first solution is faster and allows the operator to verify in real-time whether the photovoltaic modules have been inspected correctly; yet it requires careful software design to accelerate the image processing algorithm. Moreover, for real-time inspection, UAVs need to operate at certain heights and at specific time in the day so as to clearly capture details without sun reflections and facilitate processing. Moreover, note that UAVs can detect only visible external defects, while internal defects are not considered, e.g., non-functional diodes.
UAVs typically carry thermal cameras, visible light RGB cameras and photoluminescence cameras. Thermal cameras are used for thermographic analysis, while visible light cameras can store color images related to potential anomalies identified by the image processing algorithm. The idea is that images of defective photovoltaic modules, accompanied by geographical coordinates measured by the GPS sensor, can serve as a powerful and effective tool for automatic photovoltaic inspection []. However, the current accuracy of GPS sensors is in the order of several meters, whereas the required accuracy for the geographical placement of photovoltaic panels should be within a few centimeters. Therefore, with the current state of technology, computer vision algorithms cannot utilize the geographical coordinates calculated by GPS sensors to recognize and identify each photovoltaic panel but must provide a mechanism for tracking each unit and detecting potential anomalies in the image. The latter is a challenge being addressed by several techniques, as reviewed in the following.

5.1.2. Visual Inspection

Visual inspection refers to the process of examining the PV panels visually to identify signs of damage, wear, or malfunction and it is considered the fastest and most efficient way especially when conducted by experts. However, it is not suitable for modules exposed to weather conditions and it must be conducted before and after the exposure of modules to stress, either electrical, mechanical, or environmental. Common stress testing methods to evaluate modules indoor include moisture cooling or thermal cycles, liquid heat testing, ultraviolet (UV) radiation testing, mechanical loads, application of thermal stress, etc. []. International Electrotechnical Commission (IEC) standards 61646 [] and 61215 [] require illumination of more than 1000 lux to conduct visual tests towards for considering defects visible to the naked eye. Such defects include: delamination, yellowing, and blistering on the front of the module; cracks, broken parts, and discoloration of the reflective coating on the cells; burning and oxidation of metallization; bending, breaking, scratches, and poor alignment of the module frame; delamination, yellowing, scratches, burning, and more, as referenced in [,].
Specifically, visible defects such as yellowing of the encapsulant have been identified as major causes of power loss [,]. In order to identify defects visually and assess their impact, the modules are compared with a reference similar and intact module []. Such approaches can be found in the literature; Bouaichi et al. in their study [] identified discoloration on panels exposed to hot climate for a period of two years, associated to power loss of modules. The same conclusion was made by Kahoul et al. [] who also associated power loss to modules being exposed to severe environmental conditions for more than a decade, same as in []. In addition to power loss, several defects have been detected in all cases, such as cell cracking, corrosion, glass breakage, discoloration and more kinds of visible degradations. It should be noted that discoloration is commonly observed to panels that operate in extreme hot conditions, such as in deserts [].

5.1.3. I-V Curve Measurements

The current-voltage (I-V) curve measurement for PC fault detection involves the analysis of I-V characteristics of a panel towards identifying potential faults or abnormalities [], and it is considered as the most comprehensive among all detection method [].
Measurements can be conducted in either indoor or outdoor conditions, under artificial lighting sources or the sunlight, respectively. In both cases, measurements are first converted to standard test conditions (STC) towards being compared with the reference measurements set by the manufacturers. From the conducted comparison between the I-V reference and measured curves, any observed variations are associated to modules’ degradation. If the variations between the I-V curves are small, referring to minor failures on the panels, these may fail to be identified []. Moreover, it should be noted that the study of the I-V curve characteristics does not provide any information of the exact defects’ location []. An alternative measurement to identify faults involves electromagnetic methods []. Electromagnetic methods use electromagnetic waves to detect faults in PV modules through the analysis of their electrical or magnetic properties, such as electrical conductivity, electromagnetic inference (EMI), frequency responses, partial discharges, induced currents, and more. Regarding the electrical properties of PV modules, DC testings analyze and evaluate electrical parameters, such as insulation resistance, continuity and electrical output, directly related to the PV modules’ performance, [] while in AC testing, alternating current is used to test systems that operate on AC, focusing more on parameters related to AC power quality and performance [].
Other methods to identify electrical and morphological failures in PV modules include electron beam-induced current (EBIC) and scanning acoustic microscopy (SAM) [,,]. EBIC is performed by using a scanning electron microscope, which scans the solar cells with an electron beam aiming to generate electron-hole pairs towards measuring current properties []. SAM methods use sound waves to map the internal structure of the materials of panels, revealing cracks, voids and delamination; thus, it is more appropriate to detect morphological failures. The combination of both methods can provide a more comprehensive understanding of both electrical and structural integrity of PV modules, allowing for more accurate fault detection assessments [,].
One more method that belongs in this category is the differential current analysis, which involves the comparison of the current flow entering and leaving different sections of the modules [], by using current sensors placed in the PV system. Thus, the difference between measured input and output currents at different points is calculated, indicating potential defects if significant differences in the currents are measured. A major advantage of this method is that it can indicate the exact location of the fault, which makes it useful to accurately detect and locate faults for timely maintenance of modules.

5.1.4. Infrared Thermography

Infrared thermography (IR) involves measuring the surface heat of PV modules. By capturing and analyzing the temperature patterns emitted by the components of the system, possible defects can be detected. Studies have shown that there’s a correlation between cell power output and temperature variations in IR images [].
In such cases, IR cameras are used, that can detect infrared variation, referring to the heat emitted by the system. All components of the PV system may emit heat, in varying levels, which may alter in case of defects. Therefore, the IR camera can capture the temperature variations across the entire system, indicating anomalies such as hot spots. Note that hot spots are known to reduce the overall efficiency of PV modules, therefore early detection can prevent significant damages and deterioration of its efficiency [].
Based on the source of thermal excitation, thermographic measurements can be: (1) Passive or under steady conditions, when the module is scanned during its operation in outdoor environments and is not heated by external sources [] (Figure 4a); it can also be performed in doors by detaching the module and take in-lab measurements [] (Figure 4b). Setups for indoor and outdoor thermography can also be found in []. (2) Active or lock-in thermography when the module is heated periodically by an external source. This technique has less thermal impact on cells and can be performed in dark or illuminated conditions [,,,,,]; (3) Flash or pulse thermography when flashes of light are used to heat the surface of PV modules. The surface temperature rises uniformly, and a high-resolution thermal camera captures images to detect defects like bubbles and electrical connection anomalies. Various defects visible in IR images are provided in Figure 5 [].
Figure 4. (a) Indoor and (b) outdoor thermography setups [].
Figure 5. Defects in IR Imaging: (a) breakage of front glass; (b) overheated cell due to internal cell problems; (c) hot spot; (d) overheating due to external shading; (e) open junction box and overheated diode; (f) overheated junction box; (g) overheating due to shading by neighboring PV module row; (h) overheated bypass diode []. Colors from green to red indicate cold to heat-up (defected) areas. Images serve as indicative depictions of the specified defects in IR imaging, and the letterings within them are of no significance.
Several aspects need to be considered during IR imaging [] regarding emissivity setup, shading effect, and more, as well as regarding the setup of thermal camera such as its distance from the PV module since glass reflections can provoke measurement errors. Adjusting the camera angle can help reduce reflection issues []. As already mentioned, severe environmental conditions can impact defects. Modules in hot climates with detected hot spots tend to display greater degradation under IR thermography compared to those located in less hot regions [].

5.1.5. Electroluminescence Imaging

Electroluminescence (EL) imaging involves capturing images of the luminescent effect that is produced when an electric current comparable to the module’s short-circuit current (ISC) passes through the solar cells, causing them to emit EL radiation [,]. EL radiation is commonly detected by charge-coupled device (CCD) cameras that are more affordable, by indium gallium arsenide sensors that typically are more expensive, as well as by modified RGB cameras []. EL imaging is conducted in dark settings, with defects captured as dark areas/lines on grayscale images, and have been employed in several studies towards defects detection []. A reported disadvantage is due to the challenges related to the detection of faults in outdoor EL imaging due to casual dark regions and spots on the images [] that may obstruct the process. However, it could be advantageous, i.e., quick and accurate, for indoor defects detection. An EL imaging experimental setup is illustrated in Figure 6, while typical defects in EL images can be visualized in Figure 7 [].
Figure 6. EL imaging setup [].
Figure 7. Different types of defects in EL imaging []: (a) PID-s affected module; (b) crack pattern due to impacts; (c) polycrystalline PV module with cracked cells; (d) monocrystalline PV module with potential induced degradation; (e) busbar corrosion in cell; (f) cracked cell; (g) cracked cell of original orientation; (h) cracked cell of different orientation, rotated 180°; (i) cracked cell of different orientation, flipped about x-axis; (j) cracked cell of different orientation, flipped about y-axis; (k) module having undergone damp-heat exposure; (l) monocrystalline PV module with induced degradation.
The average pixel intensity of a cell in an EL image is strongly associated to the module’s maximum power output []. The latter helps to determine the degree of the module’s degradation. Moreover, EL emissions’ intensity is correlated to the degree of applied voltage, thus, defective regions can be identified by comparing EL images under different polarizations [].

5.1.6. Photoluminescence Imaging

Photoluminescence (PL) imaging is another effective approach for PV modules’ defects detection, by capturing images of the luminescent effect which occurs when the PV materials absorb photons and retransmit them as light. More specifically, the PV absorbs energy that causes electrons to jump to a higher energy level triggering them to emit light when they return to their original state. Specialized camera sensors are able to capture the emitted light, which is analyzed to detect variations of the luminescence across the PV module []. A typical PL imaging setup is shown in Figure 8.
Figure 8. Typical PL imaging setup [].
Additionally, PL imaging can be performed by using optical filters and current modulation. Optical filtering is employed to allow the selective passing of specific wavelengths of light, so as to isolate it from environmental noises. Thus, PL images are clearer and thus easier to detect underlying anomalies. Current modulation aims to improve the signal-to-noise ratio, by modulating the luminescence signal to separate it from background noises. The latter process allows for more accurate and high-quality PL imaging towards easily detecting defects in PV systems. The obtained PL images are then compared with the EL images towards identifying cracks, high-disorder areas, and poorly performing cells []. This enhanced PL imaging setup, and the resulting image are shown in Figure 9.
Figure 9. Enhanced PL imaging setup using optical filtering and current modulation [].
The combination of spectral and spatially resolved PL imaging can be used to obtain a more comprehensive understanding of the condition of materials in a PV system. The type and location of defects can be identified, providing valuable feedback for timely maintenance and quality control of modules [].

5.1.7. Ultraviolet Fluorescence Method

Ultraviolet fluorescence (UVF) was first exploited to detect discoloration issues such as yellowing effect in PV modules []. Later, dark lines in a UVF were associated with cracks in the panel.
UV-based detection is based on fluorescence effect of the material in PV modules namely polymeric lamination. Fluorescence refers to the emitted light by a material like the encapsulant that is active due to absorption of light []. A camera with UV-pass filter can capture the fluorescence, which is being interrupted by defects on solar cells. Thus, a variety of fluorescence patterns can be formed, providing information about the type of defect, their age and severity [,]. UVF experiments are conducted in darkness to eliminate inferences from ambient light, therefore, to capture a clearer fluorescent image. By exposing the PV module to sunlight prior imaging, helps to charge the materials within the module, resulting to more intense luminescence and high-quality images. Typically a 30-s exposure time is recommended []. An experimental UV fluorescence imaging setup is shown in Figure 10, including a PV module, a CCD camera, a highpass filter and a UV light source.
Figure 10. UV-F imaging setup for cells in outdoor and laboratory conditions [].
The emitted fluorescent falls within the visible region of the electromagnetic spectrum, thus it can be captured by a digital camera. To ensure accurate imaging, filters are typically employed to block out any remaining UV rays to prevent them from interfering with the captured images. Both UVF and EL imaging provide valuable information about PV modules defects resulting in similar visual representations of the condition of modules, where defective areas are highlighted with darker color []. However, UVF imaging uses external UV light while EL imaging applies electric current to the module, to excite its materials. Therefore, UVF can be implemented outdoors during the module’s operation while EL imaging requires controlled environment. Both methods can be used complementary towards providing a more comprehensive analysis of a PV module’s status [].

5.1.8. Spectroscopy

Spectroscopy is a powerful technique that is used to analyze the interaction of matter with electromagnetic radiation. When spectroscopy is applied to PV fault detection, refers to the measurements of the produced spectra by using spectrometers when the PV module is exposed to different light wavelengths. Several types of spectroscopies are available, such as photoluminescence, Raman, electroluminescence, impedance, Fourier transform infrared, and fluorescence spectroscopy.
Raman spectroscopy is capable of identifying stress, stain and several other defects on PV modules by using inelastic scattering of photons that provides information about the molecular and structural composition of materials. When laser light interacts with the molecules in the material’s structure, mainly it scatters elastically, while a small part scatters inelastically, namely the Raman scattering light. The latter results in a shift in the light’s energy which is analogous to the vibrational modes of the molecules, thus, it can characterize the material’s composition. The Raman scattering light is collected and analyzed using a spectrometer. A hyper Raman head measure is employed to measure the spectrometry maps and detect defects PV modules []. To map snail trails, point measurements are taken using Raman spectroscopy, and then converted into Raman maps, which visually represent the spatial distribution of different materials and defects across the PV module. At this step, florescence images can also be produced to provide complementary information to Raman maps. To enhance the quality of maps, Gaussian fiters can be employed to smooth the image and reduce noise effects. Such a measurement setup is shown in Figure 11 []. Raman spectroscopy also measures thermomechanical stresses in PV modules during manufacturing []. A confocal Raman spectrometer is used to measure stress in solar cells, caused by metallization, lamination, etc., during manufacturing, by detecting shifts in the Raman peaks, associated to changes in the vibrational modes of materials [].
Figure 11. Measurement setup using a Raman spectrometer and Raman superhead [].
Fluorescence spectroscopy is used in [] to study modules exposed to ageing. The module is illuminated by a light source, that excites the electrons in the material of the PV modules, making them move to higher energy states. Returning to their initial state causes them to emit light of different wavelengths, i.e., fluorescence. Fluorescence light is detected and measured using a spectrometer. The properties of the detected light such as the intensity and wavelength can provide insight regarding the properties of the module.
Fourier transform infrared spectroscopy (FTIR) is used to acquire and analyze the molecular structure of PV materials []. The interaction between mid-infrared radiation and the material can excite molecular vibrations corresponding to specific absorption wavelengths which appear in the infrared spectra, revealing detailed information about the molecular structure of the material.

5.1.9. Electromagnetic Induction-Based Measurements

Electromagnetic (EM) radiation induction for PV fault detection uses electromagnetic waves to identify faults in the modules. Usually, it is combined with IR thermography and EL to provide more comprehensive assessments since they provide complementary type of information; EM analyzes changes in the electrical properties of a PV module exposed to electromagnetic waves and can detect electrical faults, thermography measures the thermal profile of modules with an IR camera and can detect thermal anomalies, while EL measures emitted light by the modules when electric current is applied and can detect structural defects.
The combination of IR thermography with EM induction can effectively detect defects in PV modules. An electromagnetic wave is applied to the PV module to heat the electrical resistant materials, inducing currents within the module. The induced currents heat the defected areas that disrupt the flow of current, revealing impurities. An IR camera captures the thermal properties of the module, aiming to indicate faults in the module. Figure 12a illustrates an active electromagnetic induction infrared thermography system for PV cells from the literature [].
Figure 12. (a) Experimental setup of an EIIT thermography system for PV cells []; (b) thermography and EL imaging setup based on electromagnetic induction [].
Similarly, the combination of EL imaging with EM induction can provide the accuracy of PV fault detection. First, EM induction is employed, while applied electric current causes electroluminescence captured by an IR camera that provides the EL image with highlighted the defected areas.
In general, the combination of different techniques can provide a more complete picture of the module’s health status. Towards this direction, Yang et al. [] in their work compare the fusion results of a set of techniques, evaluating PV performance based on well-known metrics. The used EM induction-based thermography and EL imaging setup of Yang et al. is shown in Figure 12b.

5.1.10. Capabilities and Limitations

After reviewing the key detection technologies individually, this section aims to identify their capabilities and limitations by examining fault detection technologies in combination, aiming to answer RQ2. To achieve this, we utilize two comprehensive tables (Table 2 and Table 3) that detail the strengths and limitations of the different basic detection technologies and ultimately how they relate to various faults in photovoltaic systems, based on an extensive literature analysis.
Table 2. Cumulative table of limitations and capabilities of basic PV fault detection technologies. CV based fault detection technologies are marked in bold.
Table 3. Comparative table of limitations and capabilities of basic CV-based PV fault detection technologies.
Besides the individual application of each basic detection technology, various studies examine the comparative application of multiple CV-based technologies on PV modules. The findings of these comparative applications are summarized in Table 3.

5.2. Fault Detection Using AI-Based Computer Vision

Computer vision is rapidly gaining traction as a groundbreaking technology aiming to replace conventional monitoring systems in the PV sector, satisfying escalating global energy demands driven by the exponential growth of population. The integration of AI into PV energy systems is becoming a topic of interest, since AI is foreseen to play a pivotal role in addressing future energy requirements.
Computer vision systems in the PV sector comprise high-resolution camera, sophisticated imaging devices, such as RGB, EL, IR cameras or Light Detection and Ranging (LiDARs) devices, drones for aerial inspections, edge computing devices for on-site processing, and corresponding machine/deep learning algorithms to analyze the captured images and identify underlying issues. Thus, computer vision systems aim to make the latter components work together, to endow devices with adequate intelligence, so as to enhance the real-time monitoring, maintenance, and efficiency of PV systems based on image data analysis. The extracted information is then used by control systems for efficient decision making, leading to automated alerts, predictive maintenance and optimization actions, performance reports, and more, to ensure high efficiency and extended lifespan of PV systems. The computer vision-based inspection process is implemented similarly as experienced human workers perform visual inspections, yet they enhance the process with their energy and labor savings, risk reduction, speed, accuracy, and advanced analytical capabilities.
Essentially, the monitoring and fault detection in PV systems are automated through machine learning and deep learning algorithms and image processing techniques, as extensively acknowledged in the literature. Deep learning, in particular, has demonstrated exceptional performance in this domain. For instance, automated image classification and detection systems can replace EL image analysis of PV cells or modules, while automatic edge detection in IR imaging, defects detection and localization in RGB imaging, quality assessment of silicon wafer in PL images, and cracks segmentation tasks in EL imaging are also notable examples.
In these examples, computers or machines exhibit human intelligence, referred to as automated or AI-based methods, regardless the used data [], and are utilized for several tasks, including predictions, modeling, and predictive maintenance analyses [,,]. Specific types of algorithms are selected depending on the task; SVMs, ANNs, CNNs, etc., for both classification and regression. Regarding the most commonly used image processing techniques, Canny edge detection, color quantification, filtering, morphological operations, and data augmentation are reported. Moreover, in classification tasks, a preprocessing step includes usually features extraction and features selection methodologies. At present, AI-based methods are minimally utilized in PV monitoring. Yet, rising energy demands and the ongoing establishment of large PV farms, foretell the indispensable adoption of automated methods.

5.2.1. Machine Learning and Other Pattern Recognition Methods

Automatic classification of PV images as either normal or defective, is implemented by using machine learning algorithms. Demant et al. [] classified cracked and normal photoluminescence images using the SVM algorithm. In [], crack patterns were defined using the gradient location and orientation histogram (GLOH). A limitation of the method is that it is sensitive to region errors, which can be corrected, but will result in a very time-consuming algorithm implementation.
In order to classify a module as defective or not, image feature extraction methods can be employed, along with a classifier to assess the panels’ status. In [], Kato extracted features, using HOG [] and SURF [] algorithms, from PV image sequences resulting from a captured video, and employed an SVM classifier to assess faults resulted by the collision of PV cells with metal conductors in varying forces.
Pattern recognition methods can also be used. Demant et al. [] in their work used an SVM classifier with radial basis function kernel to automatically detect cracks in photoluminescence and IR images, by utilizing pattern recognition methods based on the extraction of local descriptors.
Other approaches, such as the one presented in [], use Fourier image reconstruction techniques towards detecting defects on PV panels. In the latter approach, faults were visible in images like bar or line-shaped objects, and the authors concluded in an effective approach, yet with some limitations; faults with more complex shapes could not be detected, and the implementation was relatively slow, reporting inference of 0.29 s for testing one cell.
Pre-processing tasks are also reported in the literature, such as filtering, towards extracting crack saliency maps []. In [], crack saliency maps were created by employing evidence filtering in EL images. The map was then processed with a local threshold process to detect cracks based on segmentation. Then, the minimum spanning tree connected crack fragments, and finally, cracks were detected by skeleton extraction. A drawback of the method was that the segmented crack may miss a part when morphological operations were applied to remove non-crack pixels, affecting the performance of the detection algorithm especially when curvilinear crystal grains were in the background.
Another reported technique included independent component analysis (ICA) []. ICA reconstruction procedure was initiated by selecting a normal image for training after being preprocessed to be centered and whitened. Then the ICA algorithm was used to compute the independent components, that were sorted in downward order and rearranged so as to select a number of them, and the unmixing matrix, that was reshaped. Thus, the image was reconstructed and binarized. As a reported disadvantage of this method, was the fact that finger interruptions in cells were handled identically to small and deep cracks.
In general, the limitations of machine learning algorithms, as already mentioned in Section 4, are due to the need for representative features for each fault type. The latter process can be time-consuming and could prove insufficient to capture the characteristics of each fault. Traditional machine learning methods fail to generalize well in case of new unseen data, which is a limitation in case of PV faults, where input images can be under various and different environmental conditions. Moreover, large datasets and high-resolution images are hard to feasibly handle and process in real-time.
Referenced methods of this section are further comparatively evaluated in Section 7, based on preset performance criteria.

5.2.2. Image Processing Techniques

Several image processing methods are also utilized for PV defects detection, based on the literature []. Alsafasfeh et al. [] captured IR images of a PV farm using a drone. The captured images were subjected to grayscale conversion and segmentation, and morphological operations were applied, along with Canny edge detection. A reported disadvantage of the proposed approach was the appearance of shadowing in images, seriously obstructing hot spots detection.
Li et al. [], aiming to detect visible faults like snake trails and dust, implemented other image processing techniques to the captured RGB images of PV systems from a drone. Image conversion to single-channel model (red, green, blue) was first implemented to make the processing more efficient and reduce complex computations, followed by image filtering by using the first derivative of the Gaussian function (FODG) towards noise reduction. Finally, to determine the faults, an edge detection algorithm was used. A disadvantage of this approach was the limitation of the drone’s flight height, restricted sun-angles and flights conducted only in ideal weather conditions, so as to provide efficient results.
Canny edge detection method was used as a preprocessing step for segmentation tasks towards the identification of hot spots in IR images [,]. Both works reported as limitation the fact that Canny edge, in case of any specular object present in the background, caused grey-level variations that were false assumed as hot spots. Segmentation is also used to detect defects in infrared module images [], yet was not efficiently performing in case of whole modules with several defects. Dotenco et al. [] employed statistical methods and other image processing methodologies to evaluate PV faults from UAV IR images. In [], the authors used a combination of segmentation and morphological methods to detect hot spots in PV panels. However, the proposed method could not detect other types of faults.
Segmentation was also combined with filtering operations for PV fault detection [,]. In [], preprocessing included filtering, color quantization, and Canny edge detection towards faults detection of different severities (normal, slight defected, severe defected) in IR images.
Finally, the vesselness-based algorithm for segmentation can also be used for the automatic fault detection scheme. This method was used in [] for EL images. It has some limitations, such as only considering cracks longer than 20 mm, and disregarding other defect types and cracks shorter than 20 mm.
Same as in traditional machine learning algorithms for PV fault detection, the limitations of image processing methods, as already mentioned in Section 4, are due to the need for exhausting manual feature extraction. Such methods are sensitive to noise and environmental variations, leading to poor adaptability, requiring fine-tuning for each specific case, and subsequently resulting in poor detection performances. Scalability for covering large PV farms, and complexity of large datasets, are also evident.
Referenced methods of this section are further comparatively evaluated in Section 7, based on preset performance criteria.

5.2.3. Deep Learning Methods

Deep learning methods are also used for PV defects detection, as reported in the literature [,,,]. For example, Demant et al. [] engaged a CNNs in the production of solar cells, to perform quality control and monitor the process. Their method, however, was constrained by the used low-resolution camera.
Mehta and Azad, in [], used a Mask FCNN model to predict defects and localize them in PV modules, also aiming to predict power losses. All methodologies mentioned refer to the detection of visible faults. Yet, there are also works that use deep learning methods to both EL and IR images. In [], the authors utilize EL images, features extraction methods including KAZE, SIFT, HOG, and SURF, and an SVM model.
It should be noted that optimal performances were reported by utilizing CNNs and transfer learning. In both works [,], the researchers proposed CNN architectures, and an open EL image dataset of PV cells, and applied transfer learning utilizing the VGG model. Evaluation results indicated deterioration in the detection performance due to labelling errors, particularly at the edges of cracks.
Akram et al. [] used a lightweight CNN model and generalization approaches to detect faults in EL images of various defects. Data augmentation was employed to balance the dataset and deal with limited original image data. The authors reported efficient performance by utilizing simple hardware; however, all results were from in-lab testing.
In another work, the same authors Akram et al. [], employ standalone deep learning and transfer learning, to detect faults in IR imaging. Regarding standalone learning, the authors utilized a lightweight CNN trained from scratch. Regarding transfer learning, the authors utilized a base pre-trained model on another EL image dataset. The second approach with transfer learning returned better performance results, while classification errors were mainly noticed for defects with small number of images in the dataset.
Greco et al. [] employed a YOLO model to detect hot spots in IR images. The proposed method conducted features fusion using bypass connections, and image segmentation for hot spots detection. Results implied a robust method with high efficiency, that could run in real-time without vast resources.
In [,], the authors use VGG and MobileNet models towards faults detection and classification from IR imaging. The captured images were subjected to feature extraction, by using SIFT and dense SIFT algorithm, and were classified with an SVM model as normal and defective. Both polynomial and radial basis function kernels were tested for the SVM, with the first one reporting optimal performance. Reported disadvantages include model complexities, and computational burden, that need to be further considered.
Wei et al. [] employed a Faster R-CNN towards detecting hot spots in thermal IR images. For the latter implementation, the weights of the pre-trained model were adjusted based on the used dataset. Moreover, preprocessing steps included Hough line transform and Canny edge detection. The used deep model reported efficient results, yet with high computational demands, posing a challenge for UAV-based implementations considering their limited capabilities in memory and GPU for processing. Transfer learning was also used by Buratti et al. []. The authors conducted features extraction from EL images and classification of faults, reaching 96% of accuracy. The used dataset comprised monocrystalline silicon cell EL images (busbar-free, with 3 busbars, and with 5 busbars), and their matching I-V parameters.
These methods and applications highlight the potential of deep learning in detecting and classifying defects in PV systems, emphasizing their effectiveness and significance in the field.
In general, the limitations of deep learning algorithms, as already mentioned in Section 4, are due to the need for large amounts of labeled and diverse input data. Data acquisition and annotation could be exhausting. Moreover, deep models require powerful GPUs especially for real-time applications. Explainability of deep models is an additional challenge, closely related to the trust on their outputs, especially for stakeholders who want to invest in this technology.
Referenced methods of this section are further comparatively evaluated in Section 7, based on preset performance criteria.

7. Evaluation of CV-Based PV Fault Detection Methodologies

Having outlined the fundamental detection and imaging technologies concerning key faults in photovoltaic systems, we now aim to evaluate the effectiveness of the detection methodologies identified in the literature, as imposed by RQ4. For this purpose, a comprehensive table, Table 5, has been structured, linking all the primary automated detection technologies with the use of computational intelligence algorithms, for detecting each specific set of anomalies in PV systems in the literature. The table records the performance of each methodology achieved in each study, in relation to (1) the ability to identify photovoltaic panels and (2), the performance of each methodology in detecting a corresponding set of anomalies.
Table 5. Evaluation summary of PV fault detection methodologies.
However, since Table 5 is extensive and conclusions cannot easily draw, a color-coded evaluation table (Table 6) was also created. More specifically, the information from the cumulative Table 5 which connects the performance of each identified technique with the corresponding faults, has been coded by using four color levels: red for performances 0–30%, yellow for 30–70%, green for 70–100%, gray when no numerical performance is reported. UAV-based applications were also considered. Next, three evaluation criteria were selected:
Table 6. Evaluation summary of PV fault detection methodologies (Performance color code: red for performances 0–30%, yellow for 30–70%, green for 70–100%, gray for no numerical performance reported). Shading anomalies are marked in blue font.
  • The total number of green indicators, showing the range of faults that the methodology effectively addressed (degree of satisfactory for anomaly coverage).
  • Whether it satisfactorily detects shading anomalies (dust, snail trails, bird droppings and snow deposits), which significantly affect cell performance, as already discussed.
  • The degree of automation provided by the methodology, consisting of two sub-questions:
    a.
    Does the methodology in this study detected photovoltaic units? (Column: “Panel Detection”)
    b.
    Was the automated image acquisition in this study via UAV technology? (Column: “UAV Inspection”)
By applying these criteria to each row of Table 6, we rank the top five optimal methods from our literature findings in the final column. The latter approach aims to identify and evaluate the best performing approaches of the literature according to preset criteria.
It should be noted that cost-effectiveness and economic viability of each proposed PV fault detection method is crucial, especially towards their large-scale adaption in the solar industry. Yet, the comparison of the various methods could not include such cost information since the latter was not reported within the articles and therefore was not available. Moreover, the cost-effectiveness of camera-based PV panel inspection systems is not easily comparable since the viability of each method depends on several factors, such as the type of the used cameras, and the size of the solar installation that will be applied to. Low cost RGB cameras can be used, however hotspots and other defects can be better detected by thermal cameras which are most cost effective. For cameras mounted on drones, high resolution is essential, which are more pricey. Combined systems integrating both thermal and high-resolution cameras are more advanced and expensive options that may offer enhanced detection capabilities. Yet costs are closely related to the size of the solar installation. Ground based inspection systems can be more affordable, yet they are not feasible solutions for large scale PV farms. Drone-based systems on the contrary, can be affordable for large scale PV installations regardless costly mounted high-resolution cameras and thermal imaging equipment, while the latter would not be economically beneficial to use it in small PV installations. Therefore, in order to compare and choose the most cost-effective method, all the above aspects should be carefully considered according to each application case.

8. Discussion

In this holistic literature review, we analyzed existing methodologies for fault detection in photovoltaic systems using computer vision, machine learning and deep learning techniques. The main observations and conclusions of the study are summarized as follows:
  • Evolution of Detection Technologies: The advancement of computer vision algorithms in recent years has significantly improved the accuracy and effectiveness of fault detection. In particular, DL techniques, especially CNNs, have proven to be highly efficient in detecting anomalies in photovoltaic units.
  • Shading Anomalies: Fault detection and regular maintenance of photovoltaic panels are critical for maintaining optimal performance. Environmental factors that increase panel shading, such as various types of dust and bird droppings, can significantly impact system performance, making continuous monitoring and cleaning essential.
  • Methodology Evaluation: From the evaluation of various methodologies, the CNN variant Resnet 50 shows a very promising future among the other literature findings. It is also evident that DL techniques, such as YOLO variants and combinations of CNN with SVM classifiers, provide high detection accuracy and cover a wide range of faults. However, traditional methods, such as thresholding techniques, while satisfactory in some cases, have limitations in covering different types of anomalies.
To further improve fault detection in photovoltaic systems and develop more efficient and economically viable solutions, the following directions are proposed:
  • Scalability and Economic Viability: The development of scalable deep learning models that can incorporate economic analyses will be important. This will enable the application of these technologies on a large scale and ensure the viability of solutions in large photovoltaic parks.
  • Real-Time Detection: Adapting and improving real-time detection techniques is crucial. Developing algorithms that can operate effectively under various environmental conditions and provide immediate feedback will enhance maintenance efficiency and the performance of photovoltaic systems.
  • Integration of Multiple Technologies: Integrating technologies such as infrared imaging, electroluminescence imaging and RGB imaging, combined with deep learning algorithms, will allow for better fault detection and diagnosis. Hybrid models that could combine different AI techniques could also be investigated to improve the accuracy of PV fault detection, as well as the integration of IoT and edge computing devices for continuous real-time data collection. All the above could lead to more comprehensive and reliable detection solutions.
  • Data augmentation and synthetic data generation: data collection can be also enhanced through augmentation techniques and the generation of synthetic data, towards creating balanced benchmark datasets of all kinds of faults to effectively train AI models.
With ongoing research and development in these areas, fault detection in photovoltaic systems is expected to improve significantly, offering higher performance and longer lifespan for photovoltaic systems. Therefore, practical implications of vision-based PV systems that could be translated into actionable insights for PV industry stakeholders, include the following:
  • Cost management due to the early detection of faults, preventing minor faults to expand and ruin the entire system, therefore reducing repairing and replacement costs for PV farms. Data analysis could also aim towards preventing faults before occurring through the identification of patterns, resulting in PV installations performance optimization. In general, data-based insights can overall improve predictive maintenance strategies of PV installations, due to the ability to prevent, plan and act.
  • Efficiency of operations for large PV installations, since automated monitoring solutions can reduce inspection time, as well as both human labor and human error.
  • By reducing human involvement, safety is provided for PV installation personnel, since inspections in the field involve hazards due to the nature of the PV structures that require the worker to climb ladders or high places in order to properly inspect, as well as their exposure to potentially adverse environmental conditions.
  • Safety is also a requirement for PV system operations. Fault detection aims towards compliance with regulations, i.e., standards and requirements for PV installations, to ensure their operation safety as predefined by corresponding guidelines.
  • Computer-vision PV fault detection strategies may lead to more consistent, reliable and efficient PV inspection, making PV installations that adapt such technologies more competitive in the market.
More analytically, regarding the color-coded evaluation of Table 6, we observe that the detection methodology from the study [] ranks first. This methodology was based on infrared thermography with UAVs, using Mask FCNNs for detecting photovoltaic units, and employed the DL network Resnet 50 to detect and classify seven out of the total seventeen anomalies. Of these, six were detected with satisfactory accuracy and one with average (less than 70%) accuracy.
The second highest performance according to our criteria, goes to the methodology presented in [], which utilizes RGB imaging via UAVs, CNN for feature extraction and SVM for anomaly classification. This method also satisfactorily covers six out of seventeen faults. However, it lacks an integrated algorithm for detecting photovoltaic units, which reduces its level of automation compared to the top-ranked method. It is worth noting that of the six faults detected with satisfactory accuracy, two are shading anomalies (dust accumulation and snail trails). Given our observations on our second research finding—shading anomalies significantly impact the performance and output of PV units—this could potentially place the methodology in the first rank depending on the priorities of each specific implementation (e.g., resource allocation relative to desired PV unit performance). Accordingly, we could continue to rank all other methodologies based on the overall degree of satisfactory anomaly coverage, anomaly detection capability and the level of automation included in each specific study.
Another significant observation from the evaluation results is that the top five methodologies all involve DL techniques, with the top three including CNNs or their variations and two using YOLO variations. In contrast, segmentation methodologies with thresholding, while providing satisfactory accuracy, are able to detect a narrow range of different anomaly types. It is also noteworthy that the SVM classifier was found in the second position. This shows that even when combined with a CNN for feature extraction, SVM remains a highly competitive ML method for effective anomaly detection in photovoltaic units, despite the current trend towards using DL algorithms in computer vision tasks.
Practical applications and real-world implementations of vision-based PV fault detection can be found solely for large scale PV installations. The most well-known PV power station is that of Kamuthi in Tamil Nadu region in India. The latter is the largest PV farm, spreading across an area of 10 km2. The farm employes drones equipped with high-resolution cameras and thermal sensors to overall monitor the status of all PV modules. Drones fly over the PV farm to collect images, and data analysis is performed afterwards to detect anomalies and various types of faults. Challenges in real-world implementations include as already mentioned in Section 6.8, mainly the effects of environmental conditions that influence the accuracy of cameras, and the demanding processing of the vast number of generated data

9. Conclusions

In this work, a comprehensive review was conducted focusing on vision-based monitoring techniques for fault detection of PV systems. The research was guided by four research questions, aiming to identify (1) the evolution of computer vision algorithms for PV fault detection within the decade, (2) to present all key monitoring techniques for PV fault detection, along with an individual and comparative assessment of their capabilities and limitations, focusing on AI-based machine vision techniques, (3) to identify the common faults in PV system and how they affect the systems’ performance and finally (4) to conclude to the most efficient CV-based methodologies through the review of the literature. Results indicated that among seventeen identified faults, shading anomalies are those that significantly impact the performance of PV units, while the top five CV-based PV fault detection methodologies, according to preset evaluation criteria, involve deep learning methods, such as CNNs and YOLO variations.
Key findings reveal that advancements of computer vision algorithms in recent years have significantly improved the accuracy of PV fault detection, indicating CNNs as highly efficient performing models for PV fault detection. Moreover, DL techniques, such as YOLO variants and combinations of CNN with SVM classifiers, can provide high detection accuracies and cover a wide range of different faults. Research concluded that fault detection and regular maintenance of photovoltaic panels are critical for maintaining optimal performance, while environmental factors are those to mainly affect the systems’ performance.
It is evident from the literature that research on PV fault detection is ongoing, and it is expected that future technological developments, such as powerful processors to run AI-powered CV algorithms in real-time on UAVs, will further enhance this area of research, offering higher efficiency and longer lifetime for PV systems. Future research direction stemming from this work suggest the development of cutting-edge CV algorithms that could combine different sensing modalities, such as thermography and electroluminescence, towards more efficient PV fault detection. Hybrid models that could combine different AI techniques could also be investigated to improve the accuracy of PV fault detection. Real-time monitoring is a requirement in fault detection; therefore, efforts could focus on the integration of IoT and edge computing devices for continuous real-time data collection. Data collection can be also enhanced through the generation of synthetic data, towards creating balanced benchmark datasets of all kinds of faults to train AI models.

Author Contributions

Conceptualization, G.A.P.; methodology, G.A.P., I.P. and S.B.; investigation, I.P. and S.B.; resources, I.P. and S.B.; writing—original draft preparation, I.P., S.B. and E.V.; writing—review and editing, I.P., S.B., E.V. and G.A.P.; visualization, G.A.P.; supervision, G.A.P. All authors have read and agreed to the published version of the manuscript.

Funding

This research received no external funding.

Data Availability Statement

Not applicable.

Acknowledgments

This work was supported by the MPhil program “Advanced Technologies in Informatics and Computers”, which was hosted by the Department of Informatics, Democritus University of Thrace, Kavala, Greece.

Conflicts of Interest

The authors declare no conflicts of interest.

References

  1. Meribout, M.; Kumar Tiwari, V.; Pablo Peña Herrera, J.; Najeeb Mahfoudh Awadh Baobaid, A. Solar Panel Inspection Techniques and Prospects. Measurement 2023, 209, 112466. [Google Scholar] [CrossRef]
  2. Prabhakaran, S.; Annie Uthra, R.; Preetharoselyn, J. Deep Learning-Based Model for Defect Detection and Localization on Photovoltaic Panels. Comput. Syst. Sci. Eng. 2023, 44, 2683–2700. [Google Scholar] [CrossRef]
  3. Miquela, A.; Bagul, D.; Ezzat, A.A. Defect Detection in Solar Photovoltaic Systems Using Unmanned Aerial Vehicles and Machine Learning. In Proceedings of the International Conference on Industrial Engineering and Operations Management, Houston, TX, USA, 13–16 June 2023; IEOM Society International: Southfield, MI, USA, 2023. [Google Scholar]
  4. Waqar Akram, M.; Li, G.; Jin, Y.; Chen, X. Failures of Photovoltaic Modules and Their Detection: A Review. Appl. Energy 2022, 313, 118822. [Google Scholar] [CrossRef]
  5. Hussain, T.; Hussain, M.; Al-Aqrabi, H.; Alsboui, T.; Hill, R. A Review on Defect Detection of Electroluminescence-Based Photovoltaic Cell Surface Images Using Computer Vision. Energies 2023, 16, 4012. [Google Scholar] [CrossRef]
  6. Hijjawi, U.; Lakshminarayana, S.; Xu, T.; Piero Malfense Fierro, G.; Rahman, M. A Review of Automated Solar Photovoltaic Defect Detection Systems: Approaches, Challenges, and Future Orientations. Sol. Energy 2023, 266, 112186. [Google Scholar] [CrossRef]
  7. Tang, W.; Yang, Q.; Dai, Z.; Yan, W. Module Defect Detection and Diagnosis for Intelligent Maintenance of Solar Photovoltaic Plants: Techniques, Systems and Perspectives. Energy 2024, 297, 131222. [Google Scholar] [CrossRef]
  8. Chao, K.-H.; Ho, S.-H.; Wang, M.-H. Modeling and Fault Diagnosis of a Photovoltaic System. Electr. Power Syst. Res. 2008, 78, 97–105. [Google Scholar] [CrossRef]
  9. Yi, Z.; Etemadi, A.H. A Novel Detection Algorithm for Line-to-Line Faults in Photovoltaic (PV) Arrays Based on Support Vector Machine (SVM). In Proceedings of the 2016 IEEE Power and Energy Society General Meeting (PESGM), Boston, MA, USA, 17–21 July 2016; IEEE: New York, NY, USA, 2016; pp. 1–4. [Google Scholar]
  10. Malof, J.M.; Bradbury, K.; Collins, L.M.; Newell, R.G.; Serrano, A.; Wu, H.; Keene, S. Image Features for Pixel-Wise Detection of Solar Photovoltaic Arrays in Aerial Imagery Using a Random Forest Classifier. In Proceedings of the 2016 IEEE International Conference on Renewable Energy Research and Applications (ICRERA), Birmingham, UK, 20–23 November 2016; IEEE: New York, NY, USA, 2016; pp. 799–803. [Google Scholar]
  11. Akram, M.W.; Li, G.; Jin, Y.; Chen, X.; Zhu, C.; Zhao, X.; Khaliq, A.; Faheem, M.; Ahmad, A. CNN Based Automatic Detection of Photovoltaic Cell Defects in Electroluminescence Images. Energy 2019, 189, 116319. [Google Scholar] [CrossRef]
  12. Wei, S.; Li, X.; Ding, S.; Yang, Q.; Yan, W. Hotspots Infrared Detection of Photovoltaic Modules Based on Hough Line Transformation and Faster-RCNN Approach. In Proceedings of the 2019 6th International Conference on Control, Decision and Information Technologies (CoDIT), Paris, France, 23–26 April 2019; IEEE: New York, NY, USA, 2019; pp. 1266–1271. [Google Scholar]
  13. Su, Y.; Tao, F.; Jin, J.; Zhang, C. Automated Overheated Region Object Detection of Photovoltaic Module with Thermography Image. IEEE J. Photovoltaics 2021, 11, 535–544. [Google Scholar] [CrossRef]
  14. Shen, Y.; Fan, T.; Lai, G.; Na, Z.; Liu, H.; Wang, Z.; Wang, Y.; Jiao, Y.; Chen, X.; Lou, Z.; et al. Modified U-Net Based Photovoltaic Array Extraction from Complex Scene in Aerial Infrared Thermal Imagery. Sol. Energy 2022, 240, 90–103. [Google Scholar] [CrossRef]
  15. Yin, W.; Lingxin, S.; Maohuan, L.; Qianlai, S.; Xiaosong, L. PV-YOLO: Lightweight YOLO for Photovoltaic Panel Fault Detection. IEEE Access 2023, 11, 10966–10976. [Google Scholar] [CrossRef]
  16. Jalal, M.; Khalil, I.U.; Haq, A. ul Deep Learning Approaches for Visual Faults Diagnosis of Photovoltaic Systems: State-of-the-Art Review. Results Eng. 2024, 23, 102622. [Google Scholar] [CrossRef]
  17. Iqbal, M.S.; Niazi, Y.A.K.; Amir Khan, U.; Lee, B.-W. Real-Time Fault Detection System for Large Scale Grid Integrated Solar Photovoltaic Power Plants. Int. J. Electr. Power Energy Syst. 2021, 130, 106902. [Google Scholar] [CrossRef]
  18. Aghaei, M.; Grimaccia, F.; Leva, S.; Mussetta, M. Unmanned Aerial Vehicles in Photovoltaic Systems Monitoring Applications. In Proceedings of the 29th European Photovoltaic Solar Energy Conference and Exhibition, Amsterdam, The Netherlands, 22–26 September 2014; pp. 2734–2739. [Google Scholar]
  19. Grimaccia, F.; Leva, S.; Dolara, A.; Aghaei, M. Survey on PV Modules’ Common Faults After an O&M Flight Extensive Campaign Over Different Plants in Italy. IEEE J. Photovolt. 2017, 7, 810–816. [Google Scholar] [CrossRef]
  20. Tsanakas, J.A.; Ha, L.D.; Al Shakarchi, F. Advanced Inspection of Photovoltaic Installations by Aerial Triangulation and Terrestrial Georeferencing of Thermal/Visual Imagery. Renew. Energy 2017, 102, 224–233. [Google Scholar] [CrossRef]
  21. Leva, S.; Aghaei, M.; Grimaccia, F. PV Power Plant Inspection by UAS: Correlation between Altitude and Detection of Defects on PV Modules. In Proceedings of the 2015 IEEE 15th International Conference on Environment and Electrical Engineering (EEEIC), Rome, Italy, 10–13 June 2015; IEEE: New York, NY, USA, 2015; pp. 1921–1926. [Google Scholar]
  22. Aghaei, M.; Dolara, A.; Leva, S.; Grimaccia, F. Image Resolution and Defects Detection in PV Inspection by Unmanned Technologies. In Proceedings of the 2016 IEEE Power and Energy Society General Meeting (PESGM), Boston, MA, USA, 17–21 July 2016; IEEE: New York, NY, USA, 2016; pp. 1–5. [Google Scholar]
  23. Grimaccia, F.; Leva, S.; Niccolai, A. PV Plant Digital Mapping for Modules’ Defects Detection by Unmanned Aerial Vehicles. IET Renew. Power Gener. 2017, 11, 1221–1228. [Google Scholar] [CrossRef]
  24. Quater, P.B.; Grimaccia, F.; Leva, S.; Mussetta, M.; Aghaei, M. Light Unmanned Aerial Vehicles (UAVs) for Cooperative Inspection of PV Plants. IEEE J. Photovolt. 2014, 4, 1107–1113. [Google Scholar] [CrossRef]
  25. Sinha, A.; Sastry, O.S.; Gupta, R. Nondestructive Characterization of Encapsulant Discoloration Effects in Crystalline-Silicon PV Modules. Sol. Energy Mater. Sol. Cells 2016, 155, 234–242. [Google Scholar] [CrossRef]
  26. International Electrotechnical Commision (IEC). IEC 61646 Ed2.0-Thin-Film Terrestrial Photovoltaic (PV) Modules-Design Qualification and Type Approval; International Electrotechnical Commision (IEC): Geneva, Switzerland, 2008. [Google Scholar]
  27. International Electrotechnical Commision (IEC). IEC 61215-2: Crystalline Silicon Terrestrial Photovoltaic (PV) Modules—Design Qualification and Type Approval; International Electrotechnical Commision (IEC): Geneva, Switzerland, 2016. [Google Scholar]
  28. Köntges, M.; Kurtz, S.; Packard, C.E.; Jahn, U.; Berger, K.; Kato, K.; Friesen, T.; Liu, H.; Van Iseghem, M. Review of Failures of Photovoltaic Modules; International Energy Agency: Putrajaya, Malaysia, 2014; ISBN 9783906042169. [Google Scholar]
  29. Bouaichi, A.; Merrouni, A.A.; El Hassani, A.; Naimi, Z.; Ikken, B.; Ghennioui, A.; Benazzouz, A.; El Amrani, A.; Messaoudi, C. Experimental Evaluation of the Discoloration Effect on PV-Modules Performance Drop. Energy Procedia 2017, 119, 818–827. [Google Scholar] [CrossRef]
  30. Kahoul, N.; Chenni, R.; Cheghib, H.; Mekhilef, S. Evaluating the Reliability of Crystalline Silicon Photovoltaic Modules in Harsh Environment. Renew. Energy 2017, 109, 66–72. [Google Scholar] [CrossRef]
  31. Bouraiou, A.; Hamouda, M.; Chaker, A.; Lachtar, S.; Neçaibia, A.; Boutasseta, N.; Mostefaoui, M. Experimental Evaluation of the Performance and Degradation of Single Crystalline Silicon Photovoltaic Modules in the Saharan Environment. Energy 2017, 132, 22–30. [Google Scholar] [CrossRef]
  32. Bouraiou, A.; Hamouda, M.; Chaker, A.; Neçaibia, A.; Mostefaoui, M.; Boutasseta, N.; Ziane, A.; Dabou, R.; Sahouane, N.; Lachtar, S. Experimental Investigation of Observed Defects in Crystalline Silicon PV Modules under Outdoor Hot Dry Climatic Conditions in Algeria. Sol. Energy 2018, 159, 475–487. [Google Scholar] [CrossRef]
  33. Tománek, P.; Škarvada, P.; Macků, R.; Grmela, L. Detection and Localization of Defects in Monocrystalline Silicon Solar Cell. Adv. Opt. Technol. 2010, 2010, 1–5. [Google Scholar] [CrossRef]
  34. Gallardo-Saavedra, S.; Hernández-Callejo, L.; Alonso-García, M.d.C.; Santos, J.D.; Morales-Aragonés, J.I.; Alonso-Gómez, V.; Moretón-Fernández, Á.; González-Rebollo, M.Á.; Martínez-Sacristán, O. Nondestructive Characterization of Solar PV Cells Defects by Means of Electroluminescence, Infrared Thermography, I–V Curves and Visual Tests: Experimental Study and Comparison. Energy 2020, 205, 117930. [Google Scholar] [CrossRef]
  35. Osawa, S.; Nakano, T.; Matsumoto, S.; Katayama, N.; Saka, Y.; Sato, H. Fault Diagnosis of Photovoltaic Modules Using AC Impedance Spectroscopy. In Proceedings of the 2016 IEEE International Conference on Renewable Energy Research and Applications (ICRERA), Birmingham, UK, 20–23 November 2016; IEEE: New York, NY, USA, 2016; pp. 210–215. [Google Scholar]
  36. Simon, M.; Meyer, E.L. Detection and Analysis of Hot-Spot Formation in Solar Cells. Sol. Energy Mater. Sol. Cells 2010, 94, 106–113. [Google Scholar] [CrossRef]
  37. Du, B.; Yang, R.; He, Y.; Wang, F.; Huang, S. Nondestructive Inspection, Testing and Evaluation for Si-Based, Thin Film and Multi-Junction Solar Cells: An Overview. Renew. Sustain. Energy Rev. 2017, 78, 1117–1151. [Google Scholar] [CrossRef]
  38. Cotfas, D.T.; Cotfas, P.A.; Kaplanis, S. Methods to Determine the Dc Parameters of Solar Cells: A Critical Review. Renew. Sustain. Energy Rev. 2013, 28, 588–596. [Google Scholar] [CrossRef]
  39. Cotfas, D.T.; Cotfas, P.A.; Kaplanis, S. Methods and Techniques to Determine the Dynamic Parameters of Solar Cells: Review. Renew. Sustain. Energy Rev. 2016, 61, 213–221. [Google Scholar] [CrossRef]
  40. Yu, J.; Song, L.; Chen, F.; Fan, P.; Sun, L.; Zhong, M.; Yang, J. Preparation of Polymer Foams with a Gradient of Cell Size: Further Exploring the Nucleation Effect of Porous Inorganic Materials in Polymer Foaming. Mater. Today Commun. 2016, 9, 1–6. [Google Scholar] [CrossRef]
  41. Meng, L.; Nagalingam, D.; Bhatia, C.S.; Street, A.G.; Phang, J.C.H. SEAM and EBIC Studies of Morphological and Electrical Defects in Polycrystalline Silicon Solar Cells. In Proceedings of the 2010 IEEE International Reliability Physics Symposium, Anaheim, CA, USA, 2–6 May 2010; IEEE: New York, NY, USA, 2010; pp. 503–507. [Google Scholar]
  42. Topolovec, S.; Krenn, H.; Würschum, R. Electrochemical Cell for in Situ Electrodeposition of Magnetic Thin Films in a Superconducting Quantum Interference Device Magnetometer. Rev. Sci. Instrum. 2015, 86, 063903. [Google Scholar] [CrossRef]
  43. de Andrade, M.C.; de Escobar, A.L.; Taylor, B.J.; Berggren, S.; Higa, B.; Dinh, S.; Fagaly, R.L.; Talvacchio, J.; Nechay, B.; Przybysz, J. Detection of Far-Field Radio-Frequency Signals by Niobium Superconducting Quantum Interference Device Arrays. IEEE Trans. Appl. Supercond. 2015, 25, 1–5. [Google Scholar] [CrossRef]
  44. Nakatani, Y.; Hayashi, T.; Itozaki, H. Observation of Polycrystalline Solar Cell Using a Laser-SQUID Microscope. IEEE Trans. Appl. Supercond. 2011, 21, 416–419. [Google Scholar] [CrossRef]
  45. Nakatani, Y.; Hayashi, T.; Miyato, Y.; Itozaki, H. SQUID Microscopy of Magnetic Field Induced in Solar Cell by Laser Spot Irradiation. Phys. Procedia 2012, 27, 340–343. [Google Scholar] [CrossRef][Green Version]
  46. Takyi, G. Correlation of Infrared Thermal Imaging Results with Visual Inspection and Current-Voltage Data of PV Modules Installed in Kumasi, a Hot, Humid Region of Sub-Saharan Africa. Technologies 2017, 5, 67. [Google Scholar] [CrossRef]
  47. Waqar Akram, M.; Li, G.; Jin, Y.; Chen, X.; Zhu, C.; Zhao, X.; Aleem, M.; Ahmad, A. Improved Outdoor Thermography and Processing of Infrared Images for Defect Detection in PV Modules. Sol. Energy 2019, 190, 549–560. [Google Scholar] [CrossRef]
  48. Rajput, P.; Tiwari, G.N.; Sastry, O.S.; Bora, B.; Sharma, V. Degradation of Mono-Crystalline Photovoltaic Modules after 22 Years of Outdoor Exposure in the Composite Climate of India. Sol. Energy 2016, 135, 786–795. [Google Scholar] [CrossRef]
  49. Akram, M.W.; Li, G.; Jin, Y.; Chen, X.; Zhu, C.; Ahmad, A. Automatic Detection of Photovoltaic Module Defects in Infrared Images with Isolated and Develop-Model Transfer Deep Learning. Sol. Energy 2020, 198, 175–186. [Google Scholar] [CrossRef]
  50. Chung, T.; Wang, C.-H.; Chang, K.-J.; Chen, S.-Y.; Hsieh, H.-H.; Huang, C.-P.; Arthur Cheng, C.-H. Evaluation of the Spatial Distribution of Series and Shunt Resistance of a Solar Cell Using Dark Lock-in Thermography. J. Appl. Phys. 2014, 115, 034901. [Google Scholar] [CrossRef]
  51. Isenberg, J.; Warta, W. Spatially Resolved Evaluation of Power Losses in Industrial Solar Cells by Illuminated Lock-in Thermography. Prog. Photovoltaics Res. Appl. 2004, 12, 339–353. [Google Scholar] [CrossRef]
  52. Kasemann, M.; Schubert, M.C.; The, M.; Köber, M.; Hermle, M.; Warta, W. Comparison of Luminescence Imaging and Illuminated Lock-in Thermography on Silicon Solar Cells. Appl. Phys. Lett. 2006, 89, 224102. [Google Scholar] [CrossRef]
  53. Netzelmann, U.; Walle, G.; Lugin, S.; Ehlen, A.; Bessert, S.; Valeske, B. Induction Thermography: Principle, Applications and First Steps towards Standardisation. Quant. Infrared Thermogr. J. 2016, 13, 170–181. [Google Scholar] [CrossRef]
  54. Vinod, P.N.; Joseph, S.; John, R. The Detection and Quantification of the Defects in Adhesive Bonded Joints of the Piezoelectric Sensors by Infrared Thermographic Nondestructive Testing. Nondestruct. Test. Eval. 2017, 32, 185–199. [Google Scholar] [CrossRef]
  55. Wang, Y.; Ke, H.; Shi, J.; Gao, B.; Tian, G. Impact Damage Detection and Characterization Using Eddy Current Pulsed Thermography. In Proceedings of the 2016 IEEE Far East NDT New Technology & Application Forum (FENDT), Nanchang, China, 22–24 June 2016; IEEE: New York, NY, USA, 2016; pp. 223–226. [Google Scholar]
  56. Glavas, H.; Vukobratovic, M.; Primorac, M.; Mustran, D. Infrared Thermography in Inspection of Photovoltaic Panels. In Proceedings of the 2017 International Conference on Smart Systems and Technologies (SST), Osijek, Croatia, 18–20 October 2017; IEEE: New York, NY, USA, 2017; pp. 63–68. [Google Scholar]
  57. Chattopadhyay, S.; Dubey, R.; Bhaduri, S.; Zachariah, S.; Singh, H.K.; Solanki, C.S.; Kottantharayil, A.; Shiradkar, N.; Arora, B.M.; Narasimhan, K.L.; et al. Correlating Infrared Thermography with Electrical Degradation of PV Modules Inspected in All-India Survey of Photovoltaic Module Reliability 2016. IEEE J. Photovolt. 2018, 8, 1800–1808. [Google Scholar] [CrossRef]
  58. Buerhop, C.; Wirsching, S.; Bemm, A.; Pickel, T.; Hohmann, P.; Nieß, M.; Vodermayer, C.; Huber, A.; Glück, B.; Mergheim, J.; et al. Evolution of Cell Cracks in PV-modules under Field and Laboratory Conditions. Prog. Photovoltaics Res. Appl. 2018, 26, 261–272. [Google Scholar] [CrossRef]
  59. Kirchartz, T.; Helbig, A.; Reetz, W.; Reuter, M.; Werner, J.H.; Rau, U. Reciprocity between electroluminescence and quantum efficiency used for the characterization of silicon solar cells. Prog. Photovolt. Res. Appl. 2009, 17, 394–402. [Google Scholar] [CrossRef]
  60. Frazão, M.; Silva, J.A.; Lobato, K.; Serra, J.M. Electroluminescence of Silicon Solar Cells Using a Consumer Grade Digital Camera. Measurement 2017, 99, 7–12. [Google Scholar] [CrossRef]
  61. Ramspeck, K.; Bothe, K.; Hinken, D.; Fischer, B.; Schmidt, J.; Brendel, R. Recombination Current and Series Resistance Imaging of Solar Cells by Combined Luminescence and Lock-in Thermography. Appl. Phys. Lett. 2007, 90, 153502. [Google Scholar] [CrossRef]
  62. Islam, M.A.; Hasanuzzaman, M.; Rahim, N.A. Investigation of the Potential Induced Degradation of On-Site Aged Polycrystalline PV Modules Operating in Malaysia. Measurement 2018, 119, 283–294. [Google Scholar] [CrossRef]
  63. Tsai, D.-M.; Wu, S.-C.; Li, W.-C. Defect Detection of Solar Cells in Electroluminescence Images Using Fourier Image Reconstruction. Sol. Energy Mater. Sol. Cells 2012, 99, 250–262. [Google Scholar] [CrossRef]
  64. Crozier, J.L.; van Dyk, E.E.; Vorster, F.J. Identifying Voltage Dependant Features in Photovoltaic Modules Using Electroluminescence Imaging. In Proceedings of the 29th EU-PVSEC, Amsterdam, The Netherlands, 22–26 September 2014; pp. 22–26. [Google Scholar]
  65. Haunschild, J.; Reis, I.E.; Chipei, T.; Demant, M.; Thaidigsmann, B.; Linse, M.; Rein, S. Rating and Sorting of Mc-Si as-Cut Wafers in Solar Cell Production Using PL Imaging. Sol. Energy Mater. Sol. Cells 2012, 106, 71–75. [Google Scholar] [CrossRef]
  66. Bhoopathy, R.; Kunz, O.; Juhl, M.; Trupke, T.; Hameiri, Z. Outdoor Photoluminescence Imaging of Photovoltaic Modules with Sunlight Excitation. Prog. Photovoltaics Res. Appl. 2018, 26, 69–73. [Google Scholar] [CrossRef]
  67. Olsen, E.; Flø, A.S. Spectral and Spatially Resolved Imaging of Photoluminescence in Multicrystalline Silicon Wafers. Appl. Phys. Lett. 2011, 99, 011903. [Google Scholar] [CrossRef]
  68. Kontges, M.; Morlier, A.; Eder, G.; Fleis, E.; Kubicek, B.; Lin, J. Review: Ultraviolet Fluorescence as Assessment Tool for Photovoltaic Modules. IEEE J. Photovolt. 2020, 10, 616–633. [Google Scholar] [CrossRef]
  69. Eder, G.C.; Voronko, Y.; Hirschl, C.; Ebner, R.; Újvári, G.; Mühleisen, W. Non-Destructive Failure Detection and Visualization of Artificially and Naturally Aged PV Modules. Energies 2018, 11, 1053. [Google Scholar] [CrossRef]
  70. Eder, G.C.; Voronko, Y.; Dimitriadis, S.; Knöbl, K.; Újvári, G.; Berger, K.A.; Halwachs, M.; Neumaier, L.; Hirschl, C. Climate Specific Accelerated Ageing Tests and Evaluation of Ageing Induced Electrical, Physical, and Chemical Changes. Prog. Photovolt. Res. Appl. 2019, 27, 934–949. [Google Scholar] [CrossRef]
  71. Morlier, A.; Siebert, M.; Kunze, I.; Mathiak, G.; Kontges, M. Detecting Photovoltaic Module Failures in the Field during Daytime with Ultraviolet Fluorescence Module Inspection. IEEE J. Photovolt. 2017, 7, 1710–1716. [Google Scholar] [CrossRef]
  72. Muehleisen, W.; Eder, G.C.; Voronko, Y.; Spielberger, M.; Sonnleitner, H.; Knoebl, K.; Ebner, R.; Ujvari, G.; Hirschl, C. Outdoor Detection and Visualization of Hailstorm Damages of Photovoltaic Plants. Renew. Energy 2018, 118, 138–145. [Google Scholar] [CrossRef]
  73. de Biasio, M.; Leitner, R.; Hirschl, C. Detection of Snail Tracks on Photovoltaic Modules Using a Combination of Raman and Fluorescence Spectroscopy. In Proceedings of the 2013 Seventh International Conference on Sensing Technology (ICST), Wellington, New Zealand, 3–5 December 2013; IEEE: New York, NY, USA, 2013; pp. 334–337. [Google Scholar]
  74. Beinert, A.J.; Romer, P.; Büchler, A.; Haueisen, V.; Aktaa, J.; Eitner, U. Thermomechanical Stress Analysis of PV Module Production Processes by Raman Spectroscopy and FEM Simulation. Energy Procedia 2017, 124, 464–469. [Google Scholar] [CrossRef]
  75. He, Y.; Du, B.; Huang, S. Noncontact Electromagnetic Induction Excited Infrared Thermography for Photovoltaic Cells and Modules Inspection. IEEE Trans. Ind. Inform. 2018, 14, 5585–5593. [Google Scholar] [CrossRef]
  76. Yang, R.; Du, B.; Duan, P.; He, Y.; Wang, H.; He, Y.; Zhang, K. Electromagnetic Induction Heating and Image Fusion of Silicon Photovoltaic Cell Electrothermography and Electroluminescence. IEEE Trans. Ind. Inform. 2020, 16, 4413–4422. [Google Scholar] [CrossRef]
  77. Kropp, T.; Berner, M.; Stoicescu, L.; Werner, J.H. Self-Sourced Daylight Electroluminescence from Photovoltaic Modules. IEEE J. Photovolt. 2017, 7, 1184–1189. [Google Scholar] [CrossRef]
  78. Köntges, M.; Kajari-Schröder, S.; Kunze, I. Cell Cracks Measured by UV Fluorescence in the Field. In Proceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition, Frankfurt, Germany, 24–28 September 2012; pp. 3033–3040. [Google Scholar]
  79. Breitenstein, O.; Bauer, J.; Bothe, K.; Hinken, D.; Mueller, J.; Kwapil, W.; Schubert, M.; Warta, W. Luminescence Imaging versus Lock-in Thermography on Solar Cells and Wafers. In Proceedings of the 26th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg, Germany, 5–6 September 2011; pp. 1031–1038. [Google Scholar]
  80. Ebner, R.; Kubicek, B.; Újvári, G.; Novalin, S.; Rennhofer, M.; Halwachs, M. Optical Characterization of Different Thin Film Module Technologies. Int. J. Photoenergy 2015, 2015, 159458. [Google Scholar] [CrossRef]
  81. Breitenstein, O.; Bauer, J.; Hinken, D.; Bothe, K. The Reliability of Thermography- and Luminescence-Based Series Resistance and Saturation Current Density Imaging. Sol. Energy Mater. Sol. Cells 2015, 137, 50–60. [Google Scholar] [CrossRef]
  82. Berardone, I.; Lopez Garcia, J.; Paggi, M. Analysis of Electroluminescence and Infrared Thermal Images of Monocrystalline Silicon Photovoltaic Modules after 20 Years of Outdoor Use in a Solar Vehicle. Sol. Energy 2018, 173, 478–486. [Google Scholar] [CrossRef]
  83. Hoyer, U.; Buerhop, C.; Jahn, U. Electroluminescence and Infrared Imaging for Quality Improvements of PV Modules. In Proceedings of the 23rd EU-PVSEC, Valencia, Spain, 1–5 September 2008; pp. 2913–2916. [Google Scholar]
  84. Mühleisen, W.; Hirschl, C.; Brantegger, G.; Neumaier, L.; Spielberger, M.; Sonnleitner, H.; Kubicek, B.; Ujvari, G.; Ebner, R.; Schwark, M.; et al. Scientific and Economic Comparison of Outdoor Characterisation Methods for Photovoltaic Power Plants. Renew. Energy 2019, 134, 321–329. [Google Scholar] [CrossRef]
  85. Sulas, D.B.; Johnston, S.; Jordan, D.C. Comparison of Photovoltaic Module Luminescence Imaging Techniques: Assessing the Influence of Lateral Currents in High-Efficiency Device Structures. Sol. Energy Mater. Sol. Cells 2019, 192, 81–87. [Google Scholar] [CrossRef]
  86. van Mölken, J.I.; Yusufoğlu, U.A.; Safiei, A.; Windgassen, H.; Khandelwal, R.; Pletzer, T.M.; Kurz, H. Impact of Micro-Cracks on the Degradation of Solar Cell Performance Based on Two-Diode Model Parameters. Energy Procedia 2012, 27, 167–172. [Google Scholar] [CrossRef]
  87. Mellit, A.; Tina, G.M.; Kalogirou, S.A. Fault Detection and Diagnosis Methods for Photovoltaic Systems: A Review. Renew. Sustain. Energy Rev. 2018, 91, 1–17. [Google Scholar] [CrossRef]
  88. Wu, Y.; Lan, Q.; Sun, Y. Application of BP Neural Network Fault Diagnosis in Solar Photovoltaic System. In Proceedings of the 2009 International Conference on Mechatronics and Automation, Changchun, China, 9–12 August 2009; IEEE: New York, NY, USA, 2009; pp. 2581–2585. [Google Scholar]
  89. Lu, X.; Lin, P.; Cheng, S.; Lin, Y.; Chen, Z.; Wu, L.; Zheng, Q. Fault Diagnosis for Photovoltaic Array Based on Convolutional Neural Network and Electrical Time Series Graph. Energy Convers. Manag. 2019, 196, 950–965. [Google Scholar] [CrossRef]
  90. Mellit, A.; Kalogirou, S.A. Artificial Intelligence Techniques for Photovoltaic Applications: A Review. Prog. Energy Combust. Sci. 2008, 34, 574–632. [Google Scholar] [CrossRef]
  91. Demant, M.; Oswald, M.; Welschehold, T.; Nold, S.; Bartsch, S.; Schoenfelder, S.; Rein, S. Micro-Cracks in Silicon Wafers and Solar Cells: Detection and Rating of Mechanical Strength and Electrical Quality. In Proceedings of the 29th European PV Solar Energy Conference and Exhibition, Amsterdam, The Netherlands, 22–26 September 2014. [Google Scholar] [CrossRef]
  92. Mikolajczyk, K.; Schmid, C. A Performance Evaluation of Local Descriptors. IEEE Trans. Pattern Anal. Mach. Intell. 2005, 27, 1615–1630. [Google Scholar] [CrossRef] [PubMed]
  93. Kato, K. PV Module Failures Observed in the Field-Solder Bond and Bypass Diode Failures. In Proceedings of the 27th EUPVSEC, Frankfurt, Germany, 24–28 September 2012. [Google Scholar]
  94. Dalal, N.; Triggs, B. Histograms of Oriented Gradients for Human Detection. In Proceedings of the 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR’05), San Diego, CA, USA, 20–25 June 2005; IEEE: New York, NY, USA, 2005; Volume 1, pp. 886–893. [Google Scholar]
  95. Bay, H.; Ess, A.; Tuytelaars, T.; Van Gool, L. Speeded-Up Robust Features (SURF). Comput. Vis. Image Underst. 2008, 110, 346–359. [Google Scholar] [CrossRef]
  96. Demant, M.; Welschehold, T.; Oswald, M.; Bartsch, S.; Brox, T.; Schoenfelder, S.; Rein, S. Microcracks in Silicon Wafers I: Inline Detection and Implications of Crack Morphology on Wafer Strength. IEEE J. Photovolt. 2016, 6, 126–135. [Google Scholar] [CrossRef]
  97. Chen, H.; Zhao, H.; Han, D.; Liu, K. Accurate and Robust Crack Detection Using Steerable Evidence Filtering in Electroluminescence Images of Solar Cells. Opt. Lasers Eng. 2019, 118, 22–33. [Google Scholar] [CrossRef]
  98. Tsai, D.-M.; Wu, S.-C.; Chiu, W.-Y. Defect Detection in Solar Modules Using ICA Basis Images. IEEE Trans. Ind. Inform. 2013, 9, 122–131. [Google Scholar] [CrossRef]
  99. Vergura, S.; Marino, F.; Carpentieri, M. Processing Infrared Image of PV Modules for Defects Classification. In Proceedings of the 2015 International Conference on Renewable Energy Research and Applications (ICRERA), Palermo, Italy, 22–25 November 2015; IEEE: New York, NY, USA, 2015; pp. 1337–1341. [Google Scholar]
  100. Alsafasfeh, M.; Abdel-Qader, I.; Bazuin, B.; Alsafasfeh, Q.; Su, W. Unsupervised Fault Detection and Analysis for Large Photovoltaic Systems Using Drones and Machine Vision. Energies 2018, 11, 2252. [Google Scholar] [CrossRef]
  101. Li, X.; Yang, Q.; Chen, Z.; Luo, X.; Yan, W. Visible Defects Detection Based on UAV-based Inspection in Large-scale Photovoltaic Systems. IET Renew. Power Gener. 2017, 11, 1234–1244. [Google Scholar] [CrossRef]
  102. Tsanakas, J.A.; Chrysostomou, D.; Botsaris, P.N.; Gasteratos, A. Fault Diagnosis of Photovoltaic Modules through Image Processing and Canny Edge Detection on Field Thermographic Measurements. Int. J. Sustain. Energy 2015, 34, 351–372. [Google Scholar] [CrossRef]
  103. Tsanakas, J.A.; Vannier, G.; Plissonnier, A.; Ha, D.L.; Barruel, F. Fault Diagnosis and Classification of Large-Scale Photovoltaic Plants through Aerial Orthophoto Thermal Mapping. In Proceedings of the 31st European Photovoltaic Solar Energy Conference and Exhibition, Hamburg, Germany, 14–18 September 2015; pp. 1783–1788. [Google Scholar]
  104. Hepp, J.; Machui, F.; Egelhaaf, H.; Brabec, C.J.; Vetter, A. Automatized Analysis of IR-images of Photovoltaic Modules and Its Use for Quality Control of Solar Cells. Energy Sci. Eng. 2016, 4, 363–371. [Google Scholar] [CrossRef]
  105. Dotenco, S.; Dalsass, M.; Winkler, L.; Wurzner, T.; Brabec, C.; Maier, A.; Gallwitz, F. Automatic Detection and Analysis of Photovoltaic Modules in Aerial Infrared Imagery. In Proceedings of the 2016 IEEE Winter Conference on Applications of Computer Vision (WACV), Lake Placid, NY, USA, 7–10 March 2016; IEEE: New York, NY, USA, 2016; pp. 1–9. [Google Scholar]
  106. Aghaei, M.; Gandelli, A.; Grimaccia, F.; Leva, S.; Zich, R.E. IR Real-Time Analyses for PV System Monitoring by Digital Image Processing Techniques. In Proceedings of the 2015 International Conference on Event-based Control, Communication, and Signal Processing (EBCCSP), Krakow, Poland, 17–19 June 2015; IEEE: New York, NY, USA, 2015; pp. 1–6. [Google Scholar]
  107. Petrosyan, A.; Hovhannisyan, A. Infrared Image Processing for Solar Cell Defect Detection. In Proceedings of the International Conference Computer Science and Information Technologies, Lviv, Ukraine, 21–23 August 2017. [Google Scholar]
  108. Stromer, D.; Vetter, A.; Oezkan, H.C.; Probst, C.; Maier, A. Enhanced Crack Segmentation (ECS): A Reference Algorithm for Segmenting Cracks in Multicrystalline Silicon Solar Cells. IEEE J. Photovolt. 2019, 9, 752–758. [Google Scholar] [CrossRef]
  109. Chen, H.; Pang, Y.; Hu, Q.; Liu, K. Solar Cell Surface Defect Inspection Based on Multispectral Convolutional Neural Network. J. Intell. Manuf. 2020, 31, 453–468. [Google Scholar] [CrossRef]
  110. Ding, S.; Yang, Q.; Li, X.; Yan, W.; Ruan, W. Transfer Learning Based Photovoltaic Module Defect Diagnosis Using Aerial Images. In Proceedings of the 2018 International Conference on Power System Technology (POWERCON), Guangzhou, China, 6–8 November 2018; IEEE: New York, NY, USA, 2018; pp. 4245–4250. [Google Scholar]
  111. Li, X.; Yang, Q.; Lou, Z.; Yan, W. Deep Learning Based Module Defect Analysis for Large-Scale Photovoltaic Farms. IEEE Trans. Energy Convers. 2019, 34, 520–529. [Google Scholar] [CrossRef]
  112. Li, X.; Yang, Q.; Wang, J.; Chen, Z.; Yan, W. Intelligent Fault Pattern Recognition of Aerial Photovoltaic Module Images Based on Deep Learning Technique. In Proceedings of the IMCIC 2018-9th International Multi-Conference on Complexity, Informatics and Cybernetics, Proceedings, Orlando, FL, USA, 13–16 March 2018; pp. 1287–1289. [Google Scholar]
  113. Demant, M.; Virtue, P.; Kovvali, A.S.; Yu, S.X.; Rein, S. Deep Learning Approach to Inline Quality Rating and Mapping of Multi-Crystalline Si-Wafers. In Proceedings of the 35th European Photovoltaic Solar Energy Conference and Exhibition, Brussels, Belgium, 24–28 September 2018; pp. 814–818. [Google Scholar]
  114. Mehta, S.; Azad, A.P.; Chemmengath, S.A.; Raykar, V.; Kalyanaraman, S. DeepSolarEye: Power Loss Prediction and Weakly Supervised Soiling Localization via Fully Convolutional Networks for Solar Panels. In Proceedings of the 2018 IEEE Winter Conference on Applications of Computer Vision (WACV), Lake Tahoe, NV, USA, 12–15 March 2018; IEEE: New York, NY, USA, 2018; pp. 333–342. [Google Scholar]
  115. Buerhop-Lutz, C.; Brabec, C.J.; Camus, C.; Hauch, J.; Doll, B.; Berger, S.; Gallwitz, F.; Maier, A.; Deitsch, S. A Benchmark for Visual Identification of Defective Solar Cells in Electroluminescence Imagery. In Proceedings of the 35th European Photovoltaic Solar Energy Conference and Exhibition, Brussels, Belgium, 24–28 September 2018; pp. 1287–1289. [Google Scholar]
  116. Deitsch, S.; Buerhop-Lutz, C.; Sovetkin, E.; Steland, A.; Maier, A.; Gallwitz, F.; Riess, C. Segmentation of Photovoltaic Module Cells in Uncalibrated Electroluminescence Images. arXiv 2018. [Google Scholar] [CrossRef]
  117. Greco, A.; Pironti, C.; Saggese, A.; Vento, M.; Vigilante, V. A Deep Learning Based Approach for Detecting Panels in Photovoltaic Plants. In Proceedings of the Proceedings of the 3rd International Conference on Applications of Intelligent Systems, Las Palmas de Gran Canaria, Spain, 7–12 January 2020; ACM: New York, NY, USA, 2020; pp. 1–7. [Google Scholar]
  118. Mahmud, A.; Shishir, M.S.R.; Hasan, R.; Rahman, M. A Comprehensive Study for Solar Panel Fault Detection Using VGG16 and VGG19 Convolutional Neural Networks. In Proceedings of the 2023 26th International Conference on Computer and Information Technology (ICCIT), Cox’s Bazar, Bangladesh, 13–15 December 2023; IEEE: New York, NY, USA, 2023; pp. 1–6. [Google Scholar]
  119. Tang, C.; Ren, H.; Xia, J.; Wang, F.; Lu, J. Automatic Defect Identification of PV Panels with IR Images through Unmanned Aircraft. IET Renew. Power Gener. 2023, 17, 3108–3119. [Google Scholar] [CrossRef]
  120. Buratti, Y.; Sowmya, A.; Evans, R.; Trupke, T.; Hameiri, Z. Half and Full Solar Cell Efficiency Binning by Deep Learning on Electroluminescence Images. Prog. Photovoltaics Res. Appl. 2022, 30, 276–287. [Google Scholar] [CrossRef]
  121. Colli, A. Failure Mode and Effect Analysis for Photovoltaic Systems. Renew. Sustain. Energy Rev. 2015, 50, 804–809. [Google Scholar] [CrossRef]
  122. Djordjevic, S.; Parlevliet, D.; Jennings, P. Detectable Faults on Recently Installed Solar Modules in Western Australia. Renew. Energy 2014, 67, 215–221. [Google Scholar] [CrossRef]
  123. Munoz, M.A.; Alonso-García, M.C.; Vela, N.; Chenlo, F. Early Degradation of Silicon PV Modules and Guaranty Conditions. Sol. Energy 2011, 85, 2264–2274. [Google Scholar] [CrossRef]
  124. Forman, S.E. Performance of Experimental Terrestrial Photovoltaic Modules. IEEE Trans. Reliab. 1982, 31, 235–245. [Google Scholar] [CrossRef]
  125. Massi Pavan, A.; Mellit, A.; De Pieri, D.; Lughi, V. A Study on the Mismatch Effect Due to the Use of Different Photovoltaic Modules Classes in Large-scale Solar Parks. Prog. Photovolt. Res. Appl. 2014, 22, 332–345. [Google Scholar] [CrossRef]
  126. Massi Pavan, A.; Tessarolo, A.; Barbini, N.; Mellit, A.; Lughi, V. The Effect of Manufacturing Mismatch on Energy Production for Large-Scale Photovoltaic Plants. Sol. Energy 2015, 117, 282–289. [Google Scholar] [CrossRef][Green Version]
  127. Massi Pavan, A.; Mellit, A.; De Pieri, D.; Kalogirou, S.A. A Comparison between BNN and Regression Polynomial Methods for the Evaluation of the Effect of Soiling in Large Scale Photovoltaic Plants. Appl. Energy 2013, 108, 392–401. [Google Scholar] [CrossRef]
  128. Cristaldi, L.; Faifer, M.; Lazzaroni, M.; Khalil, M.M.A.F.; Catelani, M.; Ciani, L. Diagnostic Architecture: A Procedure Based on the Analysis of the Failure Causes Applied to Photovoltaic Plants. Measurement 2015, 67, 99–107. [Google Scholar] [CrossRef]
  129. Massi Pavan, A.; Mellit, A.; De Pieri, D. The Effect of Soiling on Energy Production for Large-Scale Photovoltaic Plants. Sol. Energy 2011, 85, 1128–1136. [Google Scholar] [CrossRef]
  130. Adinoyi, M.J.; Said, S.A.M. Effect of Dust Accumulation on the Power Outputs of Solar Photovoltaic Modules. Renew. Energy 2013, 60, 633–636. [Google Scholar] [CrossRef]
  131. Ndiaye, A.; Charki, A.; Kobi, A.; Kébé, C.M.F.; Ndiaye, P.A.; Sambou, V. Degradations of Silicon Photovoltaic Modules: A Literature Review. Sol. Energy 2013, 96, 140–151. [Google Scholar] [CrossRef]
  132. Hu, Y.; Cao, W.; Ma, J.; Finney, S.J.; Li, D. Identifying PV Module Mismatch Faults by a Thermography-Based Temperature Distribution Analysis. IEEE Trans. Device Mater. Reliab. 2014, 14, 951–960. [Google Scholar] [CrossRef]
  133. Yang, H.; Xu, W.; Wang, H.; Narayanan, M. Investigation of Reverse Current for Crystalline Silicon Solar Cells—New Concept for a Test Standard about the Reverse Current. In Proceedings of the 2010 35th IEEE Photovoltaic Specialists Conference, Honolulu, HI, USA, 20–25 June 2010; IEEE: New York, NY, USA, 2010; pp. 002806–002810. [Google Scholar]
  134. Winter, C.J.; Sizmann, R.L.; Vant-Hull, L.L. Solar Power Plants: Fundamentals, Technology, Systems, Economics. Choice Rev. Online 1992, 29, 29–3922. [Google Scholar] [CrossRef]
  135. Rezgui, W.; Mouss, N.K.; Mouss, L.-H.; Mouss, M.D.; Amirat, Y.; Benbouzid, M. Faults Modeling of the Impedance and Reversed Polarity Types within the PV Generator Operation. In Proceedings of the 3rd International Symposium on Environmental Friendly Energies and Applications (EFEA), Paris, France, 19-21 November 2014; IEEE: New York, NY, USA, 2014; pp. 1–6. [Google Scholar]
  136. Zhao, Y.; Lehman, B.; de Palma, J.-F.; Mosesian, J.; Lyons, R. Challenges to Overcurrent Protection Devices under Line-Line Faults in Solar Photovoltaic Arrays. In Proceedings of the 2011 IEEE Energy Conversion Congress and Exposition, Phoenix, AZ, USA, 17–22 September 2011; IEEE: New York, NY, USA, 2011; pp. 20–27. [Google Scholar]
  137. Maoyi, C.; Chienyu, C.; Hsueh, C.H.; Hsieh, W.J.; Yen, E.; Ho, K.L.; Chuang, H.P.; Lee, C.Y.; Chen, H.M. The Reliability Investigation of PV Junction Box Based on 1GW Worldwide Field Database. In Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), New Orleans, LA, USA, 14–19 June 2015; IEEE: New York, NY, USA, 2015; pp. 1–4. [Google Scholar]
  138. Jakobi, K.-M.; Nasse, W.; Parterna, M.; Ansorge, F.; Baar, C.; Ring, K. Faults of Contacts in PV Module Junction Boxes Due to Fretting Corrosion. In Proceedings of the 29th EUPVSEC, Amsterdam, the Netherlands; 2014; pp. 2505–2510. [Google Scholar]
  139. Stellbogen, D. Use of PV Circuit Simulation for Fault Detection in PV Array Fields. In Proceedings of the Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference-1993 (Cat. No.93CH3283-9), Louisville, KY, USA, 10–14 May 1993; IEEE: New York, NY, USA, 1993; pp. 1302–1307. [Google Scholar]
  140. Falvo, M.C.; Capparella, S. Safety Issues in PV Systems: Design Choices for a Secure Fault Detection and for Preventing Fire Risk. Case Stud. Fire Saf. 2015, 3, 1–16. [Google Scholar] [CrossRef]
  141. Zhao, Y.; Lehman, B.; de Palma, J.-F.; Mosesian, J.; Lyons, R. Fault Analysis in Solar PV Arrays under: Low Irradiance Conditions and Reverse Connections. In Proceedings of the 2011 37th IEEE Photovoltaic Specialists Conference, Seattle, WA, USA, 19–24 June 2011; IEEE: New York, NY, USA, 2011; pp. 002000–002005. [Google Scholar]
  142. Karmacharya, I.M.; Gokaraju, R. Fault Location in Ungrounded Photovoltaic System Using Wavelets and ANN. IEEE Trans. Power Deliv. 2018, 33, 549–559. [Google Scholar] [CrossRef]
  143. Flicker, J.; Johnson, J.; Albers, M.; Ball, G. Recommendations for Isolation Monitor Ground Fault Detectors on Residential and Utility-Scale PV Systems. In Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), New Orleans, LA, USA, 14–19 June 2015; IEEE: New York, NY, USA, 2015; pp. 1–6. [Google Scholar]
  144. Johnson, J.; Montoya, M.; McCalmont, S.; Katzir, G.; Fuks, F.; Earle, J.; Fresquez, A.; Gonzalez, S.; Granata, J. Differentiating Series and Parallel Photovoltaic Arc-Faults. In Proceedings of the 2012 38th IEEE Photovoltaic Specialists Conference, Austin, TX, USA, 3–8 June 2012; IEEE: New York, NY, USA, 2012; pp. 000720–000726. [Google Scholar]
  145. McCalmonit, S. Low Cost Arc Fault Detection and Protection for PV Systems. Contract 2013, 303, 275–300. [Google Scholar]
  146. Zhao, Y.; Ball, R.; Mosesian, J.; de Palma, J.-F.; Lehman, B. Graph-Based Semi-Supervised Learning for Fault Detection and Classification in Solar Photovoltaic Arrays. IEEE Trans. Power Electron. 2015, 30, 2848–2858. [Google Scholar] [CrossRef]
  147. Lorenzo, E.; Moretón, R.; Luque, I. Dust Effects on PV Array Performance: In-field Observations with Non-uniform Patterns. Prog. Photovoltaics Res. Appl. 2014, 22, 666–670. [Google Scholar] [CrossRef]
  148. Kalogirou, S.A.; Agathokleous, R.; Panayiotou, G. On-Site PV Characterization and the Effect of Soiling on Their Performance. Energy 2013, 51, 439–446. [Google Scholar] [CrossRef]
  149. Mustafa, R.J.; Gomaa, M.R.; Al-Dhaifallah, M.; Rezk, H. Environmental Impacts on the Performance of Solar Photovoltaic Systems. Sustainability 2020, 12, 608. [Google Scholar] [CrossRef]
  150. Addabbo, P.; Angrisano, A.; Bernardi, M.L.; Gagliarde, G.; Mennella, A.; Nisi, M.; Ullo, S. A UAV Infrared Measurement Approach for Defect Detection in Photovoltaic Plants. In Proceedings of the 2017 IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace), Padua, Italy, 21–23 June 2017; IEEE: New York, NY, USA, 2017; pp. 345–350. [Google Scholar]
  151. Carletti, V.; Greco, A.; Saggese, A.; Vento, M. An Intelligent Flying System for Automatic Detection of Faults in Photovoltaic Plants. J. Ambient. Intell. Humaniz. Comput. 2020, 11, 2027–2040. [Google Scholar] [CrossRef]
  152. Bommes, L.; Pickel, T.; Buerhop-Lutz, C.; Hauch, J.; Brabec, C.; Peters, I.M. Computer Vision Tool for Detection, Mapping, and Fault Classification of Photovoltaics Modules in Aerial IR Videos. Prog. Photovolt. Res. Appl. 2021, 29, 1236–1251. [Google Scholar] [CrossRef]
  153. Pratt, L.; Govender, D.; Klein, R. Defect Detection and Quantification in Electroluminescence Images of Solar PV Modules Using U-Net Semantic Segmentation. Renew. Energy 2021, 178, 1211–1222. [Google Scholar] [CrossRef]
  154. Di Tommaso, A.; Betti, A.; Fontanelli, G.; Michelozzi, B. A Multi-Stage Model Based on YOLOv3 for Defect Detection in PV Panels Based on IR and Visible Imaging by Unmanned Aerial Vehicle. Renew. Energy 2022, 193, 941–962. [Google Scholar] [CrossRef]
  155. Li, X.; Li, W.; Yang, Q.; Yan, W.; Zomaya, A.Y. An Unmanned Inspection System for Multiple Defects Detection in Photovoltaic Plants. IEEE J. Photovolt. 2020, 10, 568–576. [Google Scholar] [CrossRef]
  156. Chen, X.; Karin, T.; Jain, A. Automated Defect Identification in Electroluminescence Images of Solar Modules. Sol. Energy 2022, 242, 20–29. [Google Scholar] [CrossRef]
  157. Li, L.; Wang, Z.; Zhang, T. GBH-YOLOv5: Ghost Convolution with BottleneckCSP and Tiny Target Prediction Head Incorporating YOLOv5 for PV Panel Defect Detection. Electronics 2023, 12, 561. [Google Scholar] [CrossRef]
  158. Naveen Venkatesh, S.; Sugumaran, V. Machine Vision Based Fault Diagnosis of Photovoltaic Modules Using Lazy Learning Approach. Measurement 2022, 191, 110786. [Google Scholar] [CrossRef]
  159. Fioresi, J.; Colvin, D.J.; Frota, R.; Gupta, R.; Li, M.; Seigneur, H.P.; Vyas, S.; Oliveira, S.; Shah, M.; Davis, K.O. Automated Defect Detection and Localization in Photovoltaic Cells Using Semantic Segmentation of Electroluminescence Images. IEEE J. Photovolt. 2022, 12, 53–61. [Google Scholar] [CrossRef]
  160. Karimi, A.M.; Fada, J.S.; Liu, J.; Braid, J.L.; Koyuturk, M.; French, R.H. Feature Extraction, Supervised and Unsupervised Machine Learning Classification of PV Cell Electroluminescence Images. In Proceedings of the 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), Waikoloa, HI, USA, 10–15 June 2018; IEEE: New York, NY, USA, 2018; pp. 0418–0424. [Google Scholar]
  161. Duranay, Z.B. Fault Detection in Solar Energy Systems: A Deep Learning Approach. Electronics 2023, 12, 4397. [Google Scholar] [CrossRef]
  162. Su, B.; Chen, H.; Zhou, Z. BAF-Detector: An Efficient CNN-Based Detector for Photovoltaic Cell Defect Detection. IEEE Trans. Ind. Electron. 2022, 69, 3161–3171. [Google Scholar] [CrossRef]
  163. Jeong, H.; Kwon, G.-R.; Lee, S.-W. Deterioration Diagnosis of Solar Module Using Thermal and Visible Image Processing. Energies 2020, 13, 2856. [Google Scholar] [CrossRef]
  164. Arenella, A.; Greco, A.; Saggese, A.; Vento, M. Real Time Fault Detection in Photovoltaic Cells by Cameras on Drones. In Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Springer: Berlin/Heidelberg, Germany, 2017; pp. 617–625. ISBN 9783319598758. [Google Scholar]
  165. Addabbo, P.; Angrisano, A.; Bernardi, M.L.; Gagliarde, G.; Mennella, A.; Nisi, M.; Ullo, S.L. UAV System for Photovoltaic Plant Inspection. IEEE Aerosp. Electron. Syst. Mag. 2018, 33, 58–67. [Google Scholar] [CrossRef]
  166. Vega Díaz, J.J.; Vlaminck, M.; Lefkaditis, D.; Orjuela Vargas, S.A.; Luong, H. Solar Panel Detection within Complex Backgrounds Using Thermal Images Acquired by UAVs. Sensors 2020, 20, 6219. [Google Scholar] [CrossRef]
  167. Dunderdale, C.; Brettenny, W.; Clohessy, C.; van Dyk, E.E. Photovoltaic Defect Classification through Thermal Infrared Imaging Using a Machine Learning Approach. Prog. Photovolt. Res. Appl. 2020, 28, 177–188. [Google Scholar] [CrossRef]
  168. Zhang, H.; Hong, X.; Zhou, S.; Wang, Q. Infrared Image Segmentation for Photovoltaic Panels Based on Res-UNet. In Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Springer: Berlin/Heidelberg, Germany, 2019; pp. 611–622. ISBN 9783030316532. [Google Scholar]
  169. de Oliveira, A.V.; Aghaei, M.; Rüther, R. Automatic Fault Detection of Photovoltaic Array by Convolutional Neural Networks during Aerial Infrared Thermography. In Proceedings of the 36th European Photovoltaic Solar Energy Conference and Exhibition, Marseille, France, 9–13 September 2019; pp. 9–13. [Google Scholar]
  170. Pierdicca, R.; Malinverni, E.S.; Piccinini, F.; Paolanti, M.; Felicetti, A.; Zingaretti, P. Deep Convolutional Neural Network for Automatic Detection of Damaged Photovoltaic Cells. Int. Arch. Photogramm. Remote Sens. Spat. Inf. Sci. 2018, 2, 893–900. [Google Scholar] [CrossRef]
  171. Zhang, J.; Yang, W.; Chen, Y.; Ding, M.; Huang, H.; Wang, B.; Gao, K.; Chen, S.; Du, R. Fast Object Detection of Anomaly Photovoltaic (PV) Cells Using Deep Neural Networks. Appl. Energy 2024, 372, 123759. [Google Scholar] [CrossRef]
  172. Dwivedi, D.; Babu, K.V.S.M.; Yemula, P.K.; Chakraborty, P.; Pal, M. Identification of Surface Defects on Solar PV Panels and Wind Turbine Blades Using Attention Based Deep Learning Model. Eng. Appl. Artif. Intell. 2024, 131, 107836. [Google Scholar] [CrossRef]
  173. Thirwani, A.; Nair, R.; Kulkarni, K. A Generative Adversarial Network Based Approach for Accurate Detection of Bright Spots in Photovoltaic Panels. In Proceedings of the 2024 11th International Conference on Signal Processing and Integrated Networks (SPIN), Noida, India, 21–22 March 2024; IEEE: New York, NY, USA, 2024; pp. 349–354. [Google Scholar]
  174. Wang, Y.; Zhang, Z.; Zhang, J.; Han, J.; Lian, J.; Qi, Y.; Liu, X.; Guo, J.; Yin, X. Research on Surface Defect Detection Method of Photovoltaic Power Generation Panels——Comparative Analysis of Detecting Model Accuracy. EAI Endorsed Trans. Energy Web 2024, 11. [Google Scholar] [CrossRef]
  175. Bao, J.; Yuan, X. YOLO-ICBAM: An Improved YOLOv4 Based on CBAM for Defect Detection. In Proceedings of the Fifteenth International Conference on Signal Processing Systems (ICSPS 2023), Xi’an, China, 17–19 November 2023; Zhang, Z., Li, C., Eds.; SPIE: Bellingham, WA, USA, 2024; p. 58. [Google Scholar]
  176. Wang, Z.; Geng, Y.; Wu, Z. An Approach to PV Fault Defect Detection Based on Computer Vision. In Proceedings of the Proceedings of the 2023 7th International Conference on Deep Learning Technologies, Dalian, China, 27–29 July 2023; ACM: New York, NY, USA, 2023; pp. 45–50. [Google Scholar]
  177. Nitturkar, K.; Vitole, S.; Jadhav, M.; Sridhar, V.G. Solar Panel Fault Detection Using Machine Vision and Image Processing Technique. In Proceedings of the 2023 International Conference on Next Generation Electronics (NEleX), Vellore, India, 14–16 December 2023; IEEE: New York, NY, USA, 2023; pp. 1–4. [Google Scholar]
  178. Faniar, A.A.; Şeker, C. Detection of Faulty Solar Panels Using Artificial Intelligence and Machine Learning Methods. In Proceedings of the 2023 IEEE 3rd Mysore Sub Section International Conference (MysuruCon), Hassan, India, 1–2 December 2023; IEEE: New York, NY, USA, 2023; pp. 1–4. [Google Scholar]
  179. Nadia, D.; Fathia, C. Automatic Detection of Solar Cell Surface Defects in Electroluminescence Images Based on YOLOv8 Algorithm. Indones. J. Electr. Eng. Comput. Sci. 2023, 32, 1392. [Google Scholar] [CrossRef]
  180. Rocha, D.; Lopes, M.; Teixeira, J.P.; Fernandes, P.A.; Morais, M.; Salome, P.M.P. A Deep Learning Approach for PV Failure Mode Detection in Infrared Images: First Insights. In Proceedings of the 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC), Philadelphia, PA, USA, 5–10 June 2022; IEEE: New York, NY, USA, 2022; pp. 0630–0632. [Google Scholar]
  181. Shou, C.; Hong, L.; Ding, W.; Shen, Q.; Zhou, W.; Jiang, Y.; Zhao, C. Defect Detection with Generative Adversarial Networks for Electroluminescence Images of Solar Cells. In Proceedings of the 2020 35th Youth Academic Annual Conference of Chinese Association of Automation (YAC), Zhanjiang, China, 16–18 October 2020; IEEE: New York, NY, USA, 2020; pp. 312–317. [Google Scholar]
Disclaimer/Publisher’s Note: The statements, opinions and data contained in all publications are solely those of the individual author(s) and contributor(s) and not of MDPI and/or the editor(s). MDPI and/or the editor(s) disclaim responsibility for any injury to people or property resulting from any ideas, methods, instructions or products referred to in the content.

Article Metrics

Citations

Article Access Statistics

Multiple requests from the same IP address are counted as one view.