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Journal: Electronics, 2025
Volume: 14
Number: 1613
1613
Article: Towards More Accurate Industrial Anomaly Detection: A Component-Level Feature-Enhancement Approach
Authors: by Xiaodong Wang, Zhiyao Xie, Fei Yan, Jiayu Wang, Jiangtao Fan, Zhiqiang Zeng, Junwen Lu, Hangqi Zhang and Nianfeng Zeng
Link: https://www.mdpi.com/2079-9292/14/8/1613

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