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Journal: Electronics, 2025
Volume: 14
Number: 381

Article: Towards Failure-Aware Inference in Harsh Operating Conditions: Robust Mobile Offloading of Pre-Trained Neural Networks
Authors: by Wenjing Liu, Zhongmin Chen and Yunzhan Gong
Link: https://www.mdpi.com/2079-9292/14/2/381

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