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Electronics2025, 14(2), 381;https://doi.org/10.3390/electronics14020381

Journal: ElectronicsVolume: 14Number: 381

Article: Towards Failure-Aware Inference in Harsh Operating Conditions: Robust Mobile Offloading of Pre-Trained Neural Networks

Authors:
Wenjing Liu^1,2,
Zhongmin Chen^3,* and
Yunzhan Gong¹

Link: https://www.mdpi.com/2079-9292/14/2/381

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