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Journal: Electronics, 2025
Volume: 14
Number: 381
Article:
Towards Failure-Aware Inference in Harsh Operating Conditions: Robust Mobile Offloading of Pre-Trained Neural Networks
Authors:
by
Wenjing Liu, Zhongmin Chen and Yunzhan Gong
Link:
https://www.mdpi.com/2079-9292/14/2/381
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