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Electronics
Volume 13
Issue 3
10.3390/electronics13030554
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Journal: Electronics, 2024
Volume: 13
Number: 554

Article: Evaluation of the Electronic Properties of Atomic Layer Deposition-Grown Ge-Doped Zinc Oxide Thin Films at Elevated Temperatures
Authors: by Rafał Knura, Katarzyna Skibińska, Sylvester Sahayaraj, Marianna Marciszko-Wiąckowska, Jakub Gwizdak, Marek Wojnicki, Piotr Żabiński, Grzegorz Sapeta, Sylwester Iwanek and Robert P. Socha
Link: https://www.mdpi.com/2079-9292/13/3/554

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