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Journal: ElectronicsVolume: 13Number: 554
Article: Evaluation of the Electronic Properties of Atomic Layer Deposition-Grown Ge-Doped Zinc Oxide Thin Films at Elevated Temperatures
- Authors:
- Rafał Knura1,
- Katarzyna Skibińska1 and
- Sylvester Sahayaraj1
- et al.
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