Order Article Reprints

Kumar Y, Lin M, Paredes C, Li D, Yang G, Kruger D, Li JJ, Morreale P. A Comprehensive Review of AI Advancement Using testFAILS and testFAILS-2 for the Pursuit of AGI. Electronics. 2024; 13(24):4991. https://doi.org/10.3390/electronics13244991

Kumar, Yulia, Mengtian Lin, Christopher Paredes, Dan Li, Guohao Yang, Dov Kruger, J. Jenny Li, and Patricia Morreale. 2024. "A Comprehensive Review of AI Advancement Using testFAILS and testFAILS-2 for the Pursuit of AGI" Electronics 13, no. 24: 4991. https://doi.org/10.3390/electronics13244991

Kumar, Y., Lin, M., Paredes, C., Li, D., Yang, G., Kruger, D., Li, J. J., & Morreale, P. (2024). A Comprehensive Review of AI Advancement Using testFAILS and testFAILS-2 for the Pursuit of AGI. Electronics, 13(24), 4991. https://doi.org/10.3390/electronics13244991