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Journal: ElectronicsVolume: 13Number: 4991
Article: A Comprehensive Review of AI Advancement Using testFAILS and testFAILS-2 for the Pursuit of AGI
  • Authors:
  • Yulia Kumar 1,2,*,
  • Mengtian Lin 1 and
  • Patricia Morreale 1
  • et al.
Link: https://www.mdpi.com/2079-9292/13/24/4991

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