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Journal: Electronics, 2024
Volume: 13
Number: 4700
Article:
Detecting Self-Admitted Technical Debts via Prompt-Based Method in Issue-Tracking Systems
Authors:
by
Jiaojiao Yu, Hao Tian, Ruiheng Li, Qiankun Zuo and Yi Di
Link:
https://www.mdpi.com/2079-9292/13/23/4700
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