Article Versions Notes

Bernardi P, Guerriero AM, Insinga G, Paganini G, Carnevale G, Coppetta M, Mischo W, Ullmann R. Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs. Electronics. 2024; 13(2):303. https://doi.org/10.3390/electronics13020303

Bernardi, Paolo, Augusto Maria Guerriero, Giorgio Insinga, Giovanni Paganini, Giambattista Carnevale, Matteo Coppetta, Walter Mischo, and Rudolf Ullmann. 2024. "Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs" Electronics 13, no. 2: 303. https://doi.org/10.3390/electronics13020303

Bernardi, P., Guerriero, A. M., Insinga, G., Paganini, G., Carnevale, G., Coppetta, M., Mischo, W., & Ullmann, R. (2024). Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs. Electronics, 13(2), 303. https://doi.org/10.3390/electronics13020303