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Journal: Electronics, 2023
Volume: 12
Number: 617

Article: Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices
Authors: by Bartłomiej Wilczkiewicz, Piotr Jankowski-Mihułowicz and Mariusz Węglarski
Link: https://www.mdpi.com/2079-9292/12/3/617

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