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Journal: Electronics, 2023
Volume: 12
Number: 563

Article: Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method
Authors: by Saleem Shahid, Gian Guido Gentili, Giancarlo Bernasconi, Hamza Nawaz and Ahsan S. Rana
Link: https://www.mdpi.com/2079-9292/12/3/563

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