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Journal: Electronics, 2023
Volume: 12
Number: 563
Article:
Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method
Authors:
by
Saleem Shahid, Gian Guido Gentili, Giancarlo Bernasconi, Hamza Nawaz and Ahsan S. Rana
Link:
https://www.mdpi.com/2079-9292/12/3/563
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