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Journal: Electronics, 2023
Volume: 12
Number: 4741
Article:
Fine-Grained Modeling of ROP Vulnerability Exploitation Process under Stack Overflow Based on Petri Nets
Authors:
by
Liumei Zhang, Wei Zhang, Yichuan Wang, Bowen Xia and Yu Han
Link:
https://www.mdpi.com/2079-9292/12/23/4741
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