Lopez Paya, L.; Cordoba, P.; Sanchez Perez, A.; Barrachina, J.; Benavent-Lledo, M.; Mulero-Pérez, D.; Garcia-Rodriguez, J.
Face Recognition Bias Assessment through Quality Estimation Models. Electronics 2023, 12, 4649.
https://doi.org/10.3390/electronics12224649
AMA Style
Lopez Paya L, Cordoba P, Sanchez Perez A, Barrachina J, Benavent-Lledo M, Mulero-Pérez D, Garcia-Rodriguez J.
Face Recognition Bias Assessment through Quality Estimation Models. Electronics. 2023; 12(22):4649.
https://doi.org/10.3390/electronics12224649
Chicago/Turabian Style
Lopez Paya, Luis, Pedro Cordoba, Angela Sanchez Perez, Javier Barrachina, Manuel Benavent-Lledo, David Mulero-Pérez, and Jose Garcia-Rodriguez.
2023. "Face Recognition Bias Assessment through Quality Estimation Models" Electronics 12, no. 22: 4649.
https://doi.org/10.3390/electronics12224649
APA Style
Lopez Paya, L., Cordoba, P., Sanchez Perez, A., Barrachina, J., Benavent-Lledo, M., Mulero-Pérez, D., & Garcia-Rodriguez, J.
(2023). Face Recognition Bias Assessment through Quality Estimation Models. Electronics, 12(22), 4649.
https://doi.org/10.3390/electronics12224649
