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Journal: Electronics, 2023
Volume: 12
Number: 2965
Article:
Color Mura Defect Detection Method Based on Channel Contrast Sensitivity Function Filtering
Authors:
by
Zhixi Wang, Huaixin Chen, Wenqiang Xie and Haoyu Wang
Link:
https://www.mdpi.com/2079-9292/12/13/2965
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