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Journal: ElectronicsVolume: 12Number: 2965
Article: Color Mura Defect Detection Method Based on Channel Contrast Sensitivity Function Filtering
  • Authors:
  • Zhixi Wang1,2,
  • Huaixin Chen1,* and
  • Wenqiang Xie1
  • et al.
Link: https://www.mdpi.com/2079-9292/12/13/2965

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