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Journal: Appl. Sci., 2024
Volume: 14
Number: 4950

Article: Reliability Analysis of Small-Sample Failure Data for Random Truncation High-Voltage Relay
Authors: by Yingzhi Zhang, Feng Han, Fang Yang, Xiaofeng Wang and Yutong Zhou
Link: https://www.mdpi.com/2076-3417/14/11/4950

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