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Journal: Appl. Sci., 2024
Volume: 14
Number: 4950
Article:
Reliability Analysis of Small-Sample Failure Data for Random Truncation High-Voltage Relay
Authors:
by
Yingzhi Zhang, Feng Han, Fang Yang, Xiaofeng Wang and Yutong Zhou
Link:
https://www.mdpi.com/2076-3417/14/11/4950
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