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Journal: Crystals, 2022
Volume: 12
Number: 1581
Article:
Reliability, Applications and Challenges of GaN HEMT Technology for Modern Power Devices: A Review
Authors:
by
Naeemul Islam, Mohamed Fauzi Packeer Mohamed, Muhammad Firdaus Akbar Jalaludin Khan, Shaili Falina, Hiroshi Kawarada and Mohd Syamsul
Link:
https://www.mdpi.com/2073-4352/12/11/1581
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