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Journal: CrystalsVolume: 12Number: 1581
Article: Reliability, Applications and Challenges of GaN HEMT Technology for Modern Power Devices: A Review
  • Authors:
  • Naeemul Islam1,
  • Mohamed Fauzi Packeer Mohamed1,* and
  • Mohd Syamsul4,5,*
  • et al.
Link: https://www.mdpi.com/2073-4352/12/11/1581

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