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Journal: MicromachinesVolume: 14Number: 1504
Article: Experimental Study on Critical Parameters Degradation of Nano PDSOI MOSFET under TDDB Stress
  • Authors:
  • Tianzhi Gao,
  • Jianye Yang and
  • Hongxia Liu*
  • et al.
Link: https://www.mdpi.com/2072-666X/14/8/1504

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