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Journal: Micromachines, 2024
Volume: 15
Number: 1026

Article: Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices
Authors: by Hao Yu, Wei Zhou, Hongxia Liu, Shulong Wang, Shupeng Chen and Chang Liu
Link: https://www.mdpi.com/2072-666X/15/8/1026

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