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Journal: Micromachines, 2024
Volume: 15
Number: 1026
Article:
Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices
Authors:
by
Hao Yu, Wei Zhou, Hongxia Liu, Shulong Wang, Shupeng Chen and Chang Liu
Link:
https://www.mdpi.com/2072-666X/15/8/1026
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