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Journal: Micromachines, 2024
Volume: 15
Number: 1516

Article: Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional nand Flash Memories
Authors: by David G. Refaldi, Gerardo Malavena, Luca Chiavarone, Alessandro S. Spinelli and Christian Monzio Compagnoni
Link: https://www.mdpi.com/2072-666X/15/12/1516

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