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Journal: Micromachines, 2024
Volume: 15
Number: 1331
Article:
Effects of 10 keV Electron Irradiation on the Performance Degradation of SiC Schottky Diode Radiation Detectors
Authors:
by
Jinlu Ruan, Liang Chen, Leidang Zhou, Xue Du, Fangbao Wang, Yapeng Zhang, Penghui Zhao and Xiaoping Ouyang
Link:
https://www.mdpi.com/2072-666X/15/11/1331
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