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Journal: Materials, 2012
Volume: 5
Number: 2498

Article: Degradation Mechanisms for GaN and GaAs High Speed Transistors
Authors: by David J. Cheney, Erica A. Douglas, Lu Liu, Chien-Fong Lo, Brent P. Gila, Fan Ren and Stephen J. Pearton
Link: https://www.mdpi.com/1996-1944/5/12/2498

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