Article Versions Notes

Doveiko D, Martin ARG, Vyshemirsky V, Stebbing S, Kubiak-Ossowska K, Rolinski O, Birch DJS, Chen Y. Nanoparticle Metrology of Silicates Using Time-Resolved Multiplexed Dye Fluorescence Anisotropy, Small Angle X-ray Scattering, and Molecular Dynamics Simulations. Materials. 2024; 17(7):1686. https://doi.org/10.3390/ma17071686

Doveiko, Daniel, Alan R. G. Martin, Vladislav Vyshemirsky, Simon Stebbing, Karina Kubiak-Ossowska, Olaf Rolinski, David J. S. Birch, and Yu Chen. 2024. "Nanoparticle Metrology of Silicates Using Time-Resolved Multiplexed Dye Fluorescence Anisotropy, Small Angle X-ray Scattering, and Molecular Dynamics Simulations" Materials 17, no. 7: 1686. https://doi.org/10.3390/ma17071686

Doveiko, D., Martin, A. R. G., Vyshemirsky, V., Stebbing, S., Kubiak-Ossowska, K., Rolinski, O., Birch, D. J. S., & Chen, Y. (2024). Nanoparticle Metrology of Silicates Using Time-Resolved Multiplexed Dye Fluorescence Anisotropy, Small Angle X-ray Scattering, and Molecular Dynamics Simulations. Materials, 17(7), 1686. https://doi.org/10.3390/ma17071686