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Journal: Materials, 2024
Volume: 17
Number: 3788

Article: Carbon and Silicon Impurity Defects in GaN: Simulating Single-Photon Emitters by First Principles
Authors: by Junxiao Yuan, Jinglei Du, Yidong Hou, Feiliang Chen and Qian Li
Link: https://www.mdpi.com/1996-1944/17/15/3788

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