Order Article Reprints

Feng ZC, Liu J, Xie D, Nafisa MT, Zhang C, Wan L, Jiang B, Lin H-H, Qiu Z-R, Lu W, et al. Optical, Structural, and Synchrotron X-ray Absorption Studies for GaN Thin Films Grown on Si by Molecular Beam Epitaxy. Materials. 2024; 17(12):2921. https://doi.org/10.3390/ma17122921

Feng, Zhe Chuan, Jiamin Liu, Deng Xie, Manika Tun Nafisa, Chuanwei Zhang, Lingyu Wan, Beibei Jiang, Hao-Hsiung Lin, Zhi-Ren Qiu, Weijie Lu, and et al. 2024. "Optical, Structural, and Synchrotron X-ray Absorption Studies for GaN Thin Films Grown on Si by Molecular Beam Epitaxy" Materials 17, no. 12: 2921. https://doi.org/10.3390/ma17122921

Feng, Z. C., Liu, J., Xie, D., Nafisa, M. T., Zhang, C., Wan, L., Jiang, B., Lin, H.-H., Qiu, Z.-R., Lu, W., Klein, B., Ferguson, I. T., & Liu, S. (2024). Optical, Structural, and Synchrotron X-ray Absorption Studies for GaN Thin Films Grown on Si by Molecular Beam Epitaxy. Materials, 17(12), 2921. https://doi.org/10.3390/ma17122921