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Journal: Materials, 2024
Volume: 17
Number: 2921

Article: Optical, Structural, and Synchrotron X-ray Absorption Studies for GaN Thin Films Grown on Si by Molecular Beam Epitaxy
Authors: by Zhe Chuan Feng, Jiamin Liu, Deng Xie, Manika Tun Nafisa, Chuanwei Zhang, Lingyu Wan, Beibei Jiang, Hao-Hsiung Lin, Zhi-Ren Qiu, Weijie Lu, Benjamin Klein, Ian T. Ferguson and Shiyuan Liu
Link: https://www.mdpi.com/1996-1944/17/12/2921

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