Order Article Reprints

Fern C-L, Liu W-J, Chang Y-H, Chiang C-C, Chen Y-T, Lu P-X, Su X-M, Lin S-H, Lin K-W. Surface Roughness-Induced Changes in Important Physical Features of CoFeSm Thin Films on Glass Substrates during Annealing. Materials. 2023; 16(21):6989. https://doi.org/10.3390/ma16216989

Fern, Chi-Lon, Wen-Jen Liu, Yung-Huang Chang, Chia-Chin Chiang, Yuan-Tsung Chen, Pei-Xin Lu, Xuan-Ming Su, Shih-Hung Lin, and Ko-Wei Lin. 2023. "Surface Roughness-Induced Changes in Important Physical Features of CoFeSm Thin Films on Glass Substrates during Annealing" Materials 16, no. 21: 6989. https://doi.org/10.3390/ma16216989

Fern, C.-L., Liu, W.-J., Chang, Y.-H., Chiang, C.-C., Chen, Y.-T., Lu, P.-X., Su, X.-M., Lin, S.-H., & Lin, K.-W. (2023). Surface Roughness-Induced Changes in Important Physical Features of CoFeSm Thin Films on Glass Substrates during Annealing. Materials, 16(21), 6989. https://doi.org/10.3390/ma16216989