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Journal: Sensors, 2009
Volume: 9
Number: 7988
Article:
A Coupled Field Multiphysics Modeling Approach to Investigate RF MEMS Switch Failure Modes under Various Operational Conditions
Authors:
by
Khaled Sadek, Jonathan Lueke and Walied Moussa
Link:
https://www.mdpi.com/1424-8220/9/10/7988
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