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Journal: Sensors, 2026
Volume: 26
Number: 6243

Article: ToF Intensity-Guided Cross-Modal Region of Interest Generation for Metal Surface Defect Detection
Authors: by Gyusang Jang, Sungan Yoon, Yosup Lee and Jeongho Cho
Link: https://www.mdpi.com/1424-8220/26/19/6243

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