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Journal: Sensors, 2023
Volume: 23
Number: 6951
Article:
Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions
Authors:
by
Zheng Yang, Fei Chen, Binbin Xu, Boquan Ma, Zege Qu and Xin Zhou
Link:
https://www.mdpi.com/1424-8220/23/15/6951
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