Electron Diffraction and Structural Imaging II

Dear Colleagues,

Over the last decade, electron diffraction (ED) and structural imaging have received renewed interest from the scientific community due to the advances in TEM instrumentation (Cs correctors, direct detection cameras, 4D STEM) and the introduction of new techniques, such as beam precession, 3D electron diffraction and ptychography. Thus, the atomic structural characterization of various types of materials (functional materials, energy materials, zeolites, minerals, organic compounds, pharmaceuticals and proteins) has become possible at the nm scale.

In particular, ED requires a far lower energy dose when compared to conventional imaging techniques, and therefore allows for the investigation of very beam-sensitive materials. ED is nowadays used for the atomic structure determination of new compounds (down to 50 nm in size), for the acquisition of phase, orientation and strain mapping, for the determination of electric fields and for the study of amorphous materials, which otherwise could not be studied by laboratory X-ray or synchrotron methods. Moreover, the development of in situ sample holders (gas, liquid, heating, etc.) has allowed the study of (bio-) materials under close-to-natural conditions and of real time reactions.

All these novel applications rely on or strongly benefit from the intrinsic symmetry of condensed matter at the atomic scale. Conventional crystals belong to one of the possible 230 space groups in 3D space, while the description of incommensurate materials requires a more complex formalism based on four to six dimensions. Even 2D or amorphous systems rely on specific assumptions of symmetry. Dynamic crystalline and symmetry evolution and phase transformations are characterized by external stimuli using in situ microscopy methods.

Due to huge success in our first Special Issue (12 contributions from the experts in Electron Diffraction and Electron Microscopy in our first issue; https://www.mdpi.com/journal/symmetry/special_issues/Electron_Diffraction_Structural_Imaging), we proposed Volume II of the Special Issue in Symmetry entitled “Electron Diffraction and Structural Imaging-Volume II”.

In this context, we welcome contributions covering any aspect of ED, structural imaging and other related in situ techniques, which make use of consolidated or advanced TEM instrumentation and have potential applications for a wide range of materials. Abstract Submission Deadline: 31st May, 2022.

Dr. Partha Pratim Das
Dr. Arturo Ponce-Pedraza
Dr. Enrico Mugnaioli
Dr. Stavros Nicolopoulos
Guest Editors

Manuscript Submission Information

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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Symmetry is an international peer-reviewed open access monthly journal published by MDPI.

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