Deep Learning Methods for Crop Monitoring and Crop Yield Prediction
A special issue of Remote Sensing (ISSN 2072-4292). This special issue belongs to the section "Remote Sensing in Agriculture and Vegetation".
Deadline for manuscript submissions: closed (30 April 2021) | Viewed by 37880
Special Issue Editors
Interests: data analytics; machine learning; time series analysis; geographic information systems; geospatial data analysis; decision support
Interests: crop monitoring with remote sensing; big earth data for cropland monitoring; agricultural remote sensing
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Remote sensing and statistical methods have been extensively used for crop assessment at regional, national, and global scales, with many studies informing national and regional agricultural policies. The sensing platforms have been largely satellite-based. However, with greater resolutions of sensing equipment and proliferation of UAVs, field scale analyses have become an additional possibility.
Recent advances in data acquisition capabilities, computational platforms (especially utilizing massive parallel processing using high-performance GPU boards), and Big Data structures have enabled the emergence of deep learning architectures, capable of performing tasks previously not feasible using conventional machine learning techniques. Characteristic features of these architectures include relying on extensive heterogenous data sets and learning from raw data rather than requiring separate feature extraction stage.
This Special Issue focuses on the latest research advances in assessing crop development and predicting crop yield throughout the growing season in open fields and greenhouses. With exploding applications of deep learning in agriculture, this Special Issue would like to invite submissions that specifically focus on target detection, qualitative and quantitative metrics for crop condition assessment, and crops yield estimation and prediction from remote sensing using deep learning techniques. Submissions in the form of research articles, reviews, perspectives, and case studies are all welcome. We especially invite studies that promote usability in terms of access to code or developed tools.
Prof. Tarmo Lipping
Dr. Miao Zhang
Dr. Nathaniel Narra
Guest Editors
Manuscript Submission Information
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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Remote Sensing is an international peer-reviewed open access semimonthly journal published by MDPI.
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Keywords
- yield prediction
- crop monitoring
- multispectral imaging
- smart agriculture
- machine learning
- deep learning
- big data analytics
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