Recent Advances in Microwave and Millimeter-Wave Imaging Sensing

Dear Colleagues,

We warmly invite you to contribute your research to the Remote Sensing journal's new Special Issue, “Microwave and Millimeter-Wave Imaging Sensing”. Microwaves and millimeter waves are electromagnetic waves between radio and infrared, which have good penetration to many media such as clouds, fog, drizzle, smoke, and common clothing. Microwave and millimeter-wave imaging sensing technology are widely used in radio astronomy, remote sensing, target detection, personnel security inspection, scene surveillance, and so on. Many imaging systems and methods based on radiometers and radar have been developed over the past several decades. With the continuous improvement of microwave and millimeter wave components, microwave and millimeter wave imaging systems have developed rapidly in recent years. How to interpret the complex radiometer and radar multidimensional data (involving frequency, polarization, amplitude, and phase) and accurately obtain the physical information of the observation scene has become a hot and difficult point in the research of microwave and millimeter-wave imaging sensing technology.

The Special Issue focuses on the recent advances in microwave and millimeter-wave imaging sensing, including theories, methods, systems, and applications. The theories involve the surface scattering model, volume scattering model, radiation brightness temperature model, radiative transfer, and imaging simulation. The methods include data processing and algorithm development, software and hardware collaboration intelligent processing, accurate measurement of targets and environmental features, and target detection and identification. The systems mainly involve devices, instruments, schemes, new ideas, and others concerning radiometers and radar. The applications include remote sensing, target detection, personnel security inspection, simulation or experiment results, and others.

The special topic presents an opportunity to show the latest technologies and developments in microwave and millimeter-wave imaging sensing. We wholeheartedly appreciate your consideration in submitting manuscripts for this Special Issue. 

Dr. Yayun Cheng
Dr. Dong Zhu
Dr. Hailiang Lu
Dr. Guoping Hu
Dr. Jian Dong
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Remote Sensing is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2700 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.