New Trends in Hard X-rays
A special issue of Quantum Beam Science (ISSN 2412-382X).
Deadline for manuscript submissions: closed (31 October 2020) | Viewed by 295
Special Issue Editor
Special Issue Information
Dear Colleagues,
Quantum Beam Science (QuBS) is pleased to announce a Special Issue on new trends in the field of hard X-ray analysis and invites original and review papers that feature cutting-edge research in analysis using hard X-rays. It has become possible to utilize hard X-rays with strong intensity for research with the emergence of third-generation synchrotron radiation facilities. Hard X-rays enable us to analyze atomic structures, electronic structures, and chemical states, among other aspects, in not only various kinds of solid states but gas and liquid phases owing to the high-incident energies. For instance, photoelectron spectroscopy employing hard X-rays—HAXPES—is a powerful and unique technique to investigate the electronic states in a surface insensitive manner. This method has been well-established accompanying an advance in sources of light, apparatuses for measurements, and spectroscopic techniques for the last few decades, and horizons have been broadened in the world of spectroscopy for varieties of materials. Meanwhile, atomic imaging in real space using hard X-rays has become common today. In addition to typical microscopic methods, X-ray holography, tomography, and ptychography have been developed and applied to obtain fully three-dimensional information about the local atomic structure and/or chemical distribution. Moreover, optics for hard X-rays and sources of hard X-rays also have been advanced strikingly. This progress in hard X-ray analysis yields useful products in an industrial application, as well as basic quantum beam science. Thus, it is the opportunity of a lifetime to collect and organize fruitful research topics on hard X-rays analysis now.
This Special Issue will include the following subject matter for which we welcome contributions:
- Progress and trends in hard X-ray photoelectron spectroscopy (HAXPES)
- Progress and trends in X-ray diffraction
- Progress and trends in extended X-ray absorption fine structure (EXAFS)
- Progress and trends in hard X-ray microscopy
- Progress and trends in hard X-ray holography, tomography, and ptychography
- Progress and trends in hard X-ray optics
- Progress and trends in hard X-ray generator and emission
With these aspects in mind, this Special Issue on new trends in hard X-ray analysis will provide a remarkable insight into the current state-of-art studies in this research field and a valuable prospect in the future.
Prof. Dr. Masaki Mizuguchi
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Quantum Beam Science is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- Hard X-ray photoelectron spectroscopy (HAXPES)
- X-ray diffraction
- extended X-ray absorption fine structure (EXAFS)
- hard X-ray microscopy
- hard X-ray holography
- hard X-ray tomography
- hard X-ray ptychography
- hard X-ray optics
- hard X-ray generator
- hard X-ray emission
Benefits of Publishing in a Special Issue
- Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
- Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
- Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
- External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
- e-Book format: Special Issues with more than 10 articles can be published as dedicated e-books, ensuring wide and rapid dissemination.
Further information on MDPI's Special Issue polices can be found here.
