Special Issue "Metrology at High-Power Laser Facilities: Primary and Secondary Laser-Driven Sources"
A special issue of Photonics (ISSN 2304-6732).
Deadline for manuscript submissions: 10 April 2024 | Viewed by 1009
Interests: extreme light; laser-produced plasma; complex laser pulses; synchronization of ultrashort pulses
Interests: XUV light sources; attosecond science
Interests: laser-driven X-ray sources
Interests: laser-driven electron acceleration
The development of chirped pulse amplification for ultrashort laser pulses made possible the production of extreme light intensities and subsequently enabled the investigation of a plethora of new processes.
The scientific community is now facing a transition phase, from laboratory to facility-grade laser-driven sources. This requires the harmonization of the metrology for laser-driven primary and secondary sources across the facilities, as a central request of the lasers scientific community and of the non-specialist beamtime beneficiaries at these facilities.
Several commercial spectral, spatial, temporal or energy metrology techniques are de facto standards in the metrology of these laser-driven sources. However, as these sources evolve, the knowledge boundary shifts towards more advanced, sophisticated, innovative, and specialized methods, to be discussed in the articles of this issue. Furthermore, the interplay and limitations of the existing metrology devices and beam sampling techniques may also be addressed.
The laser-driven sources cover the entire spectral range, from the electromagnetic pulses in the radiofrequency region and THz radiation to x-rays and gamma rays. However, a significant part of the metrology of extreme light-driven radiation sources includes electron, ion, and further particle radiation. The latest sources are also closely related to the qualification of their respective driving laser sources and can be considered as part of the proposed topic of this Photonics Special Issue.
We are inviting the scientific community to contribute research articles and review papers engaging in laser and laser-driven sources metrology. Research areas may include (but are not limited to) metrology subjects related to primary and secondary sources at laser facilities:
- pulse sampling
- review of metrology procedures and technologies
- new instrumentation for metrology
- indirect characterization of extreme light-driven sources through experiments
We look forward to receiving your contributions.
Dr. Daniel Ursescu
Dr. Zsolt Divéki
Dr. Uddhab Chaulagain
Dr. Gabriele Maria Grittani
Dr. Michael Ehret
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Photonics is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
- extreme light facilities
- ultra-intense laser pulses
- ultrafast metrology
- laser-driven radiation sources (electron, ion and proton, etc.) metrology
- diagnostic devices, procedures, and protocols for metrology
- electromagnetic, terahertz, infrared, visible, ultraviolet, X-ray and gamma radiation metrology