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Nanoscale Electrical Characterization of Low Dimensional Materials for Electronics

This special issue belongs to the section “Nanoelectronics, Nanosensors and Devices“.

Special Issue Information

Dear colleagues,

Low dimensional materials (including the broad family of 2D materials, 1D nanotube or nanowires and 0 D quantum dots) are currently gaining increasing interest in electronics/optoelectronics, as they allow us to extend the performance of traditional semiconductor devices or to demonstrate completely new device concepts and exciting physics.

In this context, combining nanometric spatial resolution with a wide range of physical properties that can be detected, scanning-probe-based characterization techniques have proved themselves to be essential tools to investigate the structural, electrical, chemical and optical properties of low dimensional systems and their heterojunctions with bulk (3D) semiconductors.

This Special Issue will be devoted to new developments in nanoscale electrical characterization techniques, and their applications to the analysis of low dimensional materials, including (i) synthesis, (ii) integration and (iii) novel device architectures. The Special Issue is open to correlation studies of local electrical/optical measurements with high resolution structural/chemical analyses, as well as to theoretical and modelling works for the interpretation of experimental results in these nanoscale systems.

It is our pleasure to invite you to submit a manuscript for this Special Issue. Full papers, short communications, and reviews are welcome.

Dr. Filippo Giannazzo
Dr. Umberto Celano
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Nanomaterials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Scanning Probe Microscopy
  • Scanning Tunneling Microscopy
  • Conductive Atomic Force Microscopy
  • Scanning Capacitance Microscopy
  • Scanning Microwave Impedance Microscopy
  • Kelvin Probe Force Microscopy
  • Scanning Near Field Optical Microscopy
  • 2D Materials
  • Nanowires
  • Quantum dots

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Nanomaterials - ISSN 2079-4991