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Energies
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Electro-Thermal Modeling, Aging and Lifetime Estimation of Power Electronics Circuits
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Electro-Thermal Modeling, Aging and Lifetime Estimation of Power Electronics Circuits

A special issue of Energies (ISSN 1996-1073). This special issue belongs to the section "F3: Power Electronics".

Deadline for manuscript submissions: 25 June 2025 | Viewed by 6112

Special Issue Editors

Dr. Cristina Morel

E-Mail Website
Guest Editor
Energy and Control of Transportation Systems Laboratory, Graduate School of Aeronautical, Aerospace, Automobile, Railway Engineering (ESTACA), 53061 Laval, France
Interests: power electronics; renewable energies; nonlinear dynamics; fault diagnosis
Special Issues, Collections and Topics in MDPI journals
Dr. Nassim Rizoug

E-Mail Website
Guest Editor
Railway Engineering (ESTACA), Mechatronic Laboratory, Graduate School of Aeronautical, Aerospace, Automobile, 53061 Laval, France
Interests: battery powered vehicles; optimisation; adaptive control; battery management systems; closed loop systems; electric vehicles; energy storage; hybrid electric vehicles; secondary cells; Lyapunov methods; energy management systems; fuel cell vehicles

Special Issue Information

Dear Colleagues,

The Guest Editor is welcoming submissions for a Special Issue of Energies entitled "Electro-Thermal Modelling, Aging and Lifetime Estimation of Power Electronics Circuits".

Power devices are employed in various industrial applications, including energy transfer (grid, wind), industrial applications (rail, photovoltaic systems) and civil equipments (electric vehicles, battery chargers, home appliance). Power circuit reliability may be affected by these devices’ high switching frequency, causing strong thermal fluctuations. Therefore, conducting an electro-thermal analysis is essential in order to enhance their reliability and to ensure their continuous operation. The device aging phenomenon is taken into consideration for lifetime estimation and degradation analysis.

Topics of interest for publication include, but are not limited to, the following:

Power electronics applications;

Electro-thermal simulation strategy and analysis;

Active thermal control methods to improve reliability.

Dr. Cristina Morel
Dr. Nassim Rizoug
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Energies is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • power electronics circuits
  • electro-thermal modeling
  • thermal impedance
  • junction temperature
  • aging and lifetime estimation
  • mission profile

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Published Papers (3 papers)

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Research

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23 pages, 6039 KiB  
Article
Optimizing Insulated-Gate Bipolar Transistors’ Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests
by Omid Alavi, Ward De Ceuninck and Michaël Daenen
Energies 2024, 17(11), 2616; https://doi.org/10.3390/en17112616 - 29 May 2024
Cited by 1 | Viewed by 1345
Abstract
This paper presents a detailed refinement and validation of two well-known lifetime prediction models for IGBTs, namely CIPS08 and SKiM63, using experimental power cycling test data. This study focuses on adapting these models to reflect the operational conditions and degradation patterns to more [...] Read more.
This paper presents a detailed refinement and validation of two well-known lifetime prediction models for IGBTs, namely CIPS08 and SKiM63, using experimental power cycling test data. This study focuses on adapting these models to reflect the operational conditions and degradation patterns to more accurately fit different IGBT types and applications. Key modifications include recalibrating the scale factor and temperature coefficients in the SKiM63 model and refining the CIPS08 model coefficients (β1 = −2.910, β2 = 1083.714, β3 = −4.521) based on the impact of temperature fluctuations, bond wire diameter, and electrical stresses observed during power cycling tests. These adjustments provide a significant shift from traditional values, with the recalibrated models offering a better fit, as evidenced by a reasonable coefficient of determination (R2) and root mean square error (RMSE). Utilizing Monte Carlo simulations with a 5% uncertainty, the study calculates the B10 lifetimes of PV inverters, demonstrating a substantial reduction from 43 years in the unmodified model to 13 years in the modified model. This emphasizes the critical need for ongoing modification and validation of predictive models based on the actual operational data to enhance the reliability and efficiency of IGBTs in power electronic systems. Full article
(This article belongs to the Special Issue Electro-Thermal Modeling, Aging and Lifetime Estimation of Power Electronics Circuits)
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16 pages, 14603 KiB  
Article
An Improved Single-Phase Multiple DC Source Inverter Topology for Distributed Energy System Applications
by Mohd Faraz Ahmad, M. Saad Bin Arif, Uvais Mustafa, Mohamed Abdelrahem, Jose Rodriguez and Shahrin Md. Ayob
Energies 2024, 17(9), 2146; https://doi.org/10.3390/en17092146 - 30 Apr 2024
Cited by 2 | Viewed by 1157
Abstract
This work presents an improved structure of a single-phase muti-input multilevel inverter (MIMLI) for distributed energy resources, which is capable of producing a nine-level output in symmetric mode and 21 levels in asymmetrical mode. The topology uses four DC sources and ten switches, [...] Read more.
This work presents an improved structure of a single-phase muti-input multilevel inverter (MIMLI) for distributed energy resources, which is capable of producing a nine-level output in symmetric mode and 21 levels in asymmetrical mode. The topology uses four DC sources and ten switches, with four switches being bidirectional and the remaining unidirectional. The operation of the circuit is analyzed in an asymmetrical mode, and switching signals are accomplished using the Nearest Level Control (NLC) PWM technique. Depending on the value of the DC sources used, the number of levels can vary. In this work, different DC source algorithms were also proposed, and the analysis of the inverter has been carried out considering the algorithms producing the maximum number of levels. The inverter was simulated in MATLAB/Simulink under steady state and dynamic conditions, achieving a 3.89% THD in output. The thermal analysis was conducted using PLECS software 4.1.2 to assess losses and efficiency. A laboratory prototype of the proposed topology was developed and tested, confirming its performance through simulation results and proving it economically viable for medium- and high-power applications. Full article
(This article belongs to the Special Issue Electro-Thermal Modeling, Aging and Lifetime Estimation of Power Electronics Circuits)
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Review

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29 pages, 2169 KiB  
Review
Power Semiconductor Junction Temperature and Lifetime Estimations: A Review
by Cristina Morel and Jean-Yves Morel
Energies 2024, 17(18), 4589; https://doi.org/10.3390/en17184589 - 12 Sep 2024
Cited by 3 | Viewed by 2867
Abstract
The lifetime of power electronic systems is the focus of both the academic and industrial worlds. Today, compact systems present high switching frequency and power dissipation density, causing high junction temperatures and strong thermal fluctuations that affect their performance and lifetime. This paper [...] Read more.
The lifetime of power electronic systems is the focus of both the academic and industrial worlds. Today, compact systems present high switching frequency and power dissipation density, causing high junction temperatures and strong thermal fluctuations that affect their performance and lifetime. This paper is a review of the existing techniques for the electro-thermal modelling of Mosfet and IGBT devices regarding lifetime estimation. The advantages and disadvantages of the methodologies used to achieve lifetime prediction are discussed, and their benefits are highlighted. All the factors required to predict power electronic device lifetime, including Mosfet and IGBT electrical models, the computation of power losses, thermal models, temperature measurement and management, lifetime models, mission profiles, cycle counting, and damage accumulation, are described and compared. Full article
(This article belongs to the Special Issue Electro-Thermal Modeling, Aging and Lifetime Estimation of Power Electronics Circuits)
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