Emerging Techniques Towards Safety Assurance and Reliability Design in Electrical Assets

Dear Colleagues,

In the era of electrification and intelligent systems, a wider array of electrical and electronic assets are being employed across various sectors, including urban mobility, smart grids, industrial automation, civilian infrastructure, etc. Ensuring the safety of these assets is of paramount importance, which not only prevents unexpected service interruptions but also safeguards the well-being of both individuals and equipment. Furthermore, their reliability is directly tied to a system’s inherent stability and its capability to withstand external interference, serving as a key indicator in the design and standardization process. Given the advancements in electrical technology and the continuously growing demand for electricity, novel techniques regarding safety and reliability are ongoing research spotlights and are expected to garner more attention in the future. Therefore, this Special Issue is dedicated to providing a platform for showcasing the latest studies about safety and reliability for electrical devices and assets, fostering interdisciplinary discussions, and spurring the progress of future industries.

In this Special Issue, original research articles and reviews are welcome. Relevant topics include, but are not limited to, the following:

• Electromagnetic compatibility, environment, and interference;
• Risk assessment and management in electrical and electronic system;
• Advanced control strategy against internal and external disturbance;
• Intentional attack and countermeasures;
• Artificial intelligence for safety and reliability design;
• Characterization and modeling of electrical components, devices and systems;
• Direct and indirect lightning protection strategies;
• Insulation coordination for internal overvoltage issues;
• Power electronics protection apparatus and its maintenance;
• Digital twin system for system diagnosis and prognosis.

We look forward to receiving your contributions.

Dr. Huamin Jie
Dr. Yuchen He
Dr. Hanchi Zhang
Guest Editors

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