Advances in Secondary Analysis of Large-Scale Educational Assessment Data: Methodological Innovations, Policy Evaluation and International Perspectives
A special issue of Education Sciences (ISSN 2227-7102). This special issue belongs to the section "STEM Education".
Deadline for manuscript submissions: 31 March 2027 | Viewed by 155
Editor
Interests: science education; inquiry teaching and learning; educational assessment; large-scale assessment in education
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Large-scale educational assessment databases have become increasingly important resources for advancing educational research, policy evaluation and methodological innovation. International and national datasets such as TIMSS, PIRLS, PISA, TALIS, ICCS, ICILS, NAEP, NEPS and other longitudinal or large-scale educational databases provide unprecedented opportunities to examine learning outcomes, educational inequality, teaching and learning processes, curriculum reform and developmental trajectories across diverse educational contexts.
This Special Issue aims to provide an interdisciplinary platform for studies utilizing secondary analysis of large-scale educational assessment data. We welcome empirical, methodological and review studies that employ advanced quantitative, computational, or mixed-method approaches to investigate educational phenomena using existing large-scale datasets.
Particular attention will be given to methodological innovations related to complex survey design, plausible values, multilevel modeling, longitudinal analysis, causal inference, psychometrics, measurement invariance, differential item functioning, learning analytics, machine learning, AI-assisted analysis and reproducibility in educational research. Studies focusing on policy evaluation, educational effectiveness, equity, achievement growth, digital learning, civic education, teacher development and cross-national comparisons are also highly encouraged.
Both single-country and cross-national studies are welcome. By bringing together researchers across educational measurement, educational psychology, comparative education, educational policy and quantitative methodology, this Special Issue seeks to advance the next generation of secondary analysis research using large-scale educational data.
Dr. Tsung-Hau Jen
Guest Editor
Manuscript Submission Information
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Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- large-scale educational assessment
- secondary data analysis
- educational policy
- longitudinal analysis
- multilevel modeling
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