Special Issue "High Precision X-Ray Measurements"

A special issue of Condensed Matter (ISSN 2410-3896).

Deadline for manuscript submissions: 31 January 2019

Special Issue Editor

Guest Editor
Dr. Alessandro Scordo

INFN Laboratori Nazionali di Frascati, Frascati (Roma), Italy
Website | E-Mail
Interests: nuclear physics; X-ray physics; detector R&D; spectrometers; mosaic crystal

Special Issue Information

Dear Colleagues,

On behalf of Condensed Matter, we would like to invite papers for consideration in a Special Issue dedicated to “High Precision X-Ray Measurements”, which will cover research activities and possible applications based on the most advanced detectors and detection technologies.

Since their discovery in 1895, the detection of X-rays had a strong impact in physics and in medicine, and a huge number of applications revolutionized our scientific and technological disciplines: X-rays probe the structure of crystals, ordinary and exotic atoms, return information on the emission from stars and galaxies but allow also to image tiny structures or the smallest virus that ordinary microscopes cannot detect.

Efforts have been done to develop new type of detectors and new techniques, aiming to obtain higher precisions both in terms of energy and position. Depending on the applications, solid state detectors, microcalorimeters and different spectrometers provide, nowadays, the best performances to spectroscopy and imaging methods. The now reachable few microns and meV resolution open the door towards ground breaking applications in fundamental physics, medicine, life science, astrophysics, cultural heritage and several other fields.

The aim of this Special Issue is to collect original contributions from different communities and research fields, of the most recent developments in X-ray detection. Main topics will include nuclear physics, e.g., exotic atoms measurements, quantum physics, XRF, XES, EXAFS, X-ray optics, plasma emission spectroscopy, monochromators, synchrotron radiation, telescopes and space engineering.

Sincerely yours

Dr. Alessandro Scordo
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Condensed Matter is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) is waived for well-prepared manuscripts submitted to this issue. Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • X-ray energy detectors
  • X-ray position detectors
  • Spectrometers
  • X-ray optics
  • Pyrolitic Graphite mosaic crystals
  • X-ray imaging
  • X-rays in astrophysics
  • X-rays in nuclear physics
  • Cultural heritage applications of X-rays
  • Medical applications
  • X-ray interferometry

Published Papers (2 papers)

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Research

Open AccessArticle Polarization Analysis in Mössbauer Reflectometry with Synchrotron Mössbauer Source
Condens. Matter 2019, 4(1), 8; https://doi.org/10.3390/condmat4010008
Received: 1 October 2018 / Revised: 14 December 2018 / Accepted: 2 January 2019 / Published: 8 January 2019
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Abstract
Polarization selection of the reflected radiation has been employed in Mössbauer reflectivity measurements with a synchrotron Mössbauer source (SMS). The polarization of resonantly scattered radiation differs from the polarization of an incident wave so the Mössbauer reflectivity contains a scattering component with 90°
[...] Read more.
Polarization selection of the reflected radiation has been employed in Mössbauer reflectivity measurements with a synchrotron Mössbauer source (SMS). The polarization of resonantly scattered radiation differs from the polarization of an incident wave so the Mössbauer reflectivity contains a scattering component with 90° rotated polarization relative to the π-polarization of the SMS for some hyperfine transitions. We have shown that the selection of this rotated π→σ component from total reflectivity gives an unusual angular dependence of reflectivity characterized by a peak near the critical angle of the total external reflection. In the case of collinear antiferromagnetic interlayer ordering, the “magnetic” maxima on the reflectivity angular curve are formed practically only by radiation with this rotated polarization. The first experiment on Mössbauer reflectivity with a selection of the rotated polarization discovers the predicted peak near the critical angle. The measurement of the rotated π→σ polarization component in Mössbauer reflectivity spectra excludes the interference with non-resonant electronic scattering and simplifies the spectrum shape near the critical angle allowing for an improved data interpretation in the case of poorly resolved spectra. It is shown that the selected component of Mössbauer reflectivity with rotated polarization is characterized by enhanced surface sensitivity, determined by the “squared standing waves” depth dependence. Therefore, the new approach has interesting perspectives for investigations of surfaces, ultrathin layers and multilayers having complicated magnetic structures. Full article
(This article belongs to the Special Issue High Precision X-Ray Measurements)
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Open AccessArticle DAFNE-Light DXR1 Soft X-Ray Synchrotron Radiation Beamline: Characteristics and XAFS Applications
Condens. Matter 2019, 4(1), 7; https://doi.org/10.3390/condmat4010007
Received: 21 November 2018 / Revised: 19 December 2018 / Accepted: 3 January 2019 / Published: 8 January 2019
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Abstract
X-ray Absorption Fine Structure Spectroscopy (XAFS) is a powerful technique to investigate the local atomic geometry and the chemical state of atoms in different types of materials, especially if lacking a long-range order, such as nanomaterials, liquids, amorphous and highly disordered systems, and
[...] Read more.
X-ray Absorption Fine Structure Spectroscopy (XAFS) is a powerful technique to investigate the local atomic geometry and the chemical state of atoms in different types of materials, especially if lacking a long-range order, such as nanomaterials, liquids, amorphous and highly disordered systems, and polymers containing metallic atoms. The INFN-LNF DAΦNE-Light DXR1 beam line is mainly dedicated to soft X-ray absorption spectroscopy; it collects the radiation of a wiggler insertion device and covers the energy range from 0.9 to 3.0 keV or the range going from the K-edge of Na through to the K-edge of Cl. The characteristics of the beamline are reported here together with the XAFS spectra of reference compounds, in order to show some of the information achievable with this X-ray spectroscopy. Additionally, some examples of XAFS spectroscopy applications are also reported. Full article
(This article belongs to the Special Issue High Precision X-Ray Measurements)
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Figure 1

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