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DAFNE-Light DXR1 Soft X-Ray Synchrotron Radiation Beamline: Characteristics and XAFS Applications

INFN, Laboratori Nazionali di Frascati, 00044 Frascati (RM), Italy
Condens. Matter 2019, 4(1), 7; https://doi.org/10.3390/condmat4010007
Received: 21 November 2018 / Revised: 19 December 2018 / Accepted: 3 January 2019 / Published: 8 January 2019
(This article belongs to the Special Issue High Precision X-Ray Measurements)
X-ray Absorption Fine Structure Spectroscopy (XAFS) is a powerful technique to investigate the local atomic geometry and the chemical state of atoms in different types of materials, especially if lacking a long-range order, such as nanomaterials, liquids, amorphous and highly disordered systems, and polymers containing metallic atoms. The INFN-LNF DAΦNE-Light DXR1 beam line is mainly dedicated to soft X-ray absorption spectroscopy; it collects the radiation of a wiggler insertion device and covers the energy range from 0.9 to 3.0 keV or the range going from the K-edge of Na through to the K-edge of Cl. The characteristics of the beamline are reported here together with the XAFS spectra of reference compounds, in order to show some of the information achievable with this X-ray spectroscopy. Additionally, some examples of XAFS spectroscopy applications are also reported. View Full-Text
Keywords: soft X-rays; XAFS; beamlines; synchrotron radiation; material science soft X-rays; XAFS; beamlines; synchrotron radiation; material science
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Balerna, A. DAFNE-Light DXR1 Soft X-Ray Synchrotron Radiation Beamline: Characteristics and XAFS Applications. Condens. Matter 2019, 4, 7.

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