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Open AccessArticle

Pyrolitic Graphite Mosaic Crystal Thickness and Mosaicity Optimization for an Extended Source Von Hamos X-ray Spectrometer

1
Laboratori Nazionali di Frascati (INFN), Via E. Fermi 40, 00044 Frascati, Italy
2
Horia Hulubei National Institute of Physics and Nuclear Engineering (IFIN-HH), Strada Reactorului 30, MG-6 Măgurele, Romania
3
Stefan-Meyer-Institut für Subatomare Physik, Boltzmanngasse 3, 1090 Vienna, Austria
*
Author to whom correspondence should be addressed.
Condens. Matter 2019, 4(2), 38; https://doi.org/10.3390/condmat4020038
Received: 28 January 2019 / Revised: 15 March 2019 / Accepted: 29 March 2019 / Published: 3 April 2019
(This article belongs to the Special Issue High Precision X-Ray Measurements)
Bragg spectroscopy, one of the best established experimental techniques for high energy resolution X-ray measurements, has always been limited to the measurement of photons produced from well collimated (tens of microns) or point-like sources; recently, the VOXES collaboration at INFN National Laboratories of Frascati developed a prototype of a high resolution and high precision X-ray spectrometer working also with extended isotropic sources. The realized spectrometer makes use of Highly Annealed Pyrolitic Graphite (HAPG) crystals in a “semi”-Von Hamos configuration, in which the position detector is rotated with respect to the standard Von Hamos one, to increase the dynamic energy range, and shows energy resolutions at the level of 0.1% for photon energies up to 10 keV and effective source sizes in the range 400–1200 μ m in the dispersive plane. Such wide effective source dimensions are achieved using a double slit system to produce a virtual point-like source between the emitting target and the crystal. The spectrometer performances in terms of reflection efficiency and peak resolution depend on several parameters, among which a special role is played by the crystal mosaicity and thickness. In this work, we report the measurements of the Cu(K α 1 , 2 ) and the Fe(K α 1 , 2 ) lines performed with different mosaicity and thickness crystals in order to investigate the influence of the parameters on the peak resolution and on the reflection efficiency mentioned above. View Full-Text
Keywords: X- and γ-ray instruments; X- and γ-ray sources, mirrors, gratings, and detectors; X-ray and γ-ray spectrometers; optical materials; X-ray diffraction; optical instruments and equipment X- and γ-ray instruments; X- and γ-ray sources, mirrors, gratings, and detectors; X-ray and γ-ray spectrometers; optical materials; X-ray diffraction; optical instruments and equipment
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Scordo, A.; Curceanu, C.; Miliucci, M.; Sirghi, F.; Zmeskal, J. Pyrolitic Graphite Mosaic Crystal Thickness and Mosaicity Optimization for an Extended Source Von Hamos X-ray Spectrometer. Condens. Matter 2019, 4, 38.

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