Artificial Intelligence in Fault Diagnosis and Signal Processing
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Computing and Artificial Intelligence".
Deadline for manuscript submissions: closed (20 January 2025) | Viewed by 33749
Special Issue Editors
Interests: condition monitoring; power quality; fault diagnosis; signal processing; vibration analysis; electrical power engineering; control theory; instrumentation
* We dedicate the memory of the editor, Prof. Dr. Roque A. Osornio-Rios, who passed away during this special issue period.
Special Issues, Collections and Topics in MDPI journals
Interests: electrical machines and drives; diagnostics of electrical machines; renewable energies and smart grids
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The detection and diagnosis of faults is essential in industrial processes, as the early detection of faults avoids damage that may be irreparable to machinery, which would reduce the performance of the control system and reduce the process efficiency, which would result in a decrease in production. Additionally, in terms of industrial safety, this would facilitate safer operations, reducing the risk to plant workers. Therefore, the early detection and correct diagnosis of faults will facilitate decision making that allows corrective actions to be taken to repair damaged components. In recent years, various machine fault detection techniques have emerged; additionally, artificial intelligence and signal processing are essential to achieving this goal. However, the topic continues to generate new trends in methodologies related to multiple fault detection, novelty detection, data mining, development in hardware, etc.
The goal of this issue is to bring researchers and industrial practitioners together to share their research findings and present ideas that are relevant in the field of fault diagnosis using artificial intelligence and signal processing.
Prof. Dr. Roque Alfredo Osornio-Rios
Dr. Athanasios Karlis
Dr. Andres Bustillo Iglesias
Guest Editors
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Keywords
- neural networks
- machine learning
- sensors
- novelty detection
- data mining
- signal processing methods
- signal processing implementation
- FPGA
- HIL
- industrial applications
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