Welcoming New Early Career Editorial Board Members of Metrology

Metrology (ISSN 2673-8244) is pleased to announce that the following 12 researchers have been added to our group of 2025–2026 Early Career Editorial Board Members. Applications for the Early Career Editorial Board are now closed. Please join us in congratulating them on joining the Metrology community!

	Name: Dr. Livio D'Alvia Affiliation: University of Rome La Sapienza, Rome, Italy Interests: biomedical measurement; cultural heritage monitoring; industrial measurement; sensors development and validation
	Name: Dr. Wenpan Li Affiliation: Huazhong University of Science and Technology, Wuhan, China Interests: robot vision; three-dimensional measurement; optical metrology; digital image correlation
	Name: Dr. Mojtaba Ahmadieh Khanesar Affiliation: University of Nottingham, Nottingham, UK Interests: robotics; control; metrology; mechatronics; machine learning
	Name: Dr. Yongkang Lu Affiliation: Dalian University of Technology, Dalian, China Interests: precision measurement; large-scale metrology; combined measurement; multi-sensor fusion; uncertainty evaluation; visual inspection
	Name: Prof. Dr. Ruitao Yang Affiliation: Harbin Institute of Technology, Harbin, China Interests: laser interferometry; laser ranging; laser frequency stabilization; optical frequency comb generation; optical frequency comb stabilization; multi-DoF measurement
	Name: Dr. Haijian Li Affiliation: Xi'an Modern Chemistry Research Institute, Xi'an, China Interests: combustion plume; diagnosis; controlling; modeling; deep learning
	Name: Dr. Bruno Furtado de Moura Affiliation: Universidade Federal do Espírito Santo (UFES), Espírito Santo, Brazil Interests: conductance sensors; metrology and instrumentation measurement; multiphase flow; flow measurement; thermal instrumentation; energy management; Bayesian methods for instrumentation
	Name: Dr. Long Ye Affiliation: University of Edinburgh, Edinburgh, UK Interests: surface metrology; manufacturing metrology; intelligent manufacturing; advanced manufacturing; additive manufacturing; process monitoring and control
	Name: Dr. Ruben Alaniz-Plata Affiliation: Universidad Autónoma de Baja California, Mexicali, Mexico Interests: machine vision systems; laser scanning; precision engineering; 3D metrology; information fusion; stereovision systems; neural networks; automatic measurements
	Name: Dr. Yingjie Mei Affiliation: Harbin Institute of Technology, Weihai, China Interests: measurement; assembly; digital twin
	Name: Dr. Fabien Viprey Affiliation: Arts et Metiers Institute of Technology, Cluny, France Interests: 5-axis machining; 5-machine-tool; geometric errors; volumetric accuracy; errors compensation; digital twin; high-speed machining; cutting forces modeling
	Name: Dr. Xin Xu Affiliation: Tsinghua University, Beijing, China Interests: laser interferometry; precision measurement and instrumentation; geometric metrology; gravitational wave detection; multi-degree-of-freedom measurement; displacement and distance measurement; biochemical sensing

Thank you for your attention and support. Prof. Dr. Han Haitjema, Editor-in-Chief of Metrology, and the entire Editorial Board welcome young scholars to join us!