Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179

Ameet Chavan; Praveen Palakurthi; Eric MacDonald; Joseph Neff; Eric Bozeman

doi:10.3390/jlpea2040210

,

and

¹

University of Texas at El Paso, Electrical and Computer Engineering, El Paso, TX 79968, USA

²

SPAWAR System Center, Navy, San Diego, CA 92152, USA

^*

Author to whom correspondence should be addressed.

J. Low Power Electron. Appl.2012, 2(4), 210;https://doi.org/10.3390/jlpea2040210

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We have found the following error in the title of this article which was recently published in J. Low Power Electron. Appl. [1]:

The correct title should be: Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation.

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References

Chavan, A.; Palakurthi, P.; MacDonald, E.; Neff, J.; Bozeman, E. Hardened Flip-Flop Optimized for Subthreshold Operation Heavy Ion Characterization of a Radiation. J. Low Power Electron. Appl. 2012, 2, 168–179. [Google Scholar] [CrossRef]

© 2012 by the authors; licensee MDPI, Basel, Switzerland. This article is an open-access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).

Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179

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