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Correction of J. Low Power Electron. Appl. 2012, 2(2), 168-179.

Open AccessCorrection
J. Low Power Electron. Appl. 2012, 2(4), 210; https://doi.org/10.3390/jlpea2040210

Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179

1
University of Texas at El Paso, Electrical and Computer Engineering, El Paso, TX 79968, USA
2
SPAWAR System Center, Navy, San Diego, CA 92152, USA
*
Author to whom correspondence should be addressed.
Received: 25 September 2012 / Accepted: 25 September 2012 / Published: 26 September 2012
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Chavan, A.; Palakurthi, P.; MacDonald, E.; Neff, J.; Bozeman, E. Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179. J. Low Power Electron. Appl. 2012, 2, 210.

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