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Journal: J. Low Power Electron. Appl., 2012
Volume: 2
Number: 210
210
Article: Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179
Authors: by Ameet Chavan, Praveen Palakurthi, Eric MacDonald, Joseph Neff and Eric Bozeman
Link: https://www.mdpi.com/2079-9268/2/4/210

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