Chavan, A.; Palakurthi, P.; MacDonald, E.; Neff, J.; Bozeman, E.
Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179. J. Low Power Electron. Appl. 2012, 2, 210.
https://doi.org/10.3390/jlpea2040210
AMA Style
Chavan A, Palakurthi P, MacDonald E, Neff J, Bozeman E.
Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179. Journal of Low Power Electronics and Applications. 2012; 2(4):210.
https://doi.org/10.3390/jlpea2040210
Chicago/Turabian Style
Chavan, Ameet, Praveen Palakurthi, Eric MacDonald, Joseph Neff, and Eric Bozeman.
2012. "Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179" Journal of Low Power Electronics and Applications 2, no. 4: 210.
https://doi.org/10.3390/jlpea2040210
APA Style
Chavan, A., Palakurthi, P., MacDonald, E., Neff, J., & Bozeman, E.
(2012). Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179. Journal of Low Power Electronics and Applications, 2(4), 210.
https://doi.org/10.3390/jlpea2040210