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Open AccessArticle

Tailoring of Highly Intense THz Radiation Through High Brightness Electron Beams Longitudinal Manipulation

1
National Institute of Nuclear Physics (INFN) and Department of Physics, “Sapienza” University of Rome, Piazzale A. Moro 2, I-00185 Rome, Italy
2
Frascati National Laboratories, INFN, via Enrico Fermi 40, I-00044 Frascati, Italy
3
INFN and Department of Physics, “Tor Vergata” University, via della Ricerca Scientifica 1, 00133 Rome, Italy
4
INFN and Department of Basic and Applied Sciences for Engineering (SBAI), “Sapienza” University of Rome, Via A. Scarpa 14, 00161 Rome, Italy
*
Author to whom correspondence should be addressed.
Academic Editor: Christoph Hauri
Appl. Sci. 2016, 6(2), 56; https://doi.org/10.3390/app6020056
Received: 4 November 2015 / Revised: 11 January 2016 / Accepted: 3 February 2016 / Published: 18 February 2016
(This article belongs to the Special Issue Frontiers in Terahertz Science and Technology)
The ultra-short electron beams, produced through the velocity bunching compression technique at the SPARC_LAB test Facility (Frascati, Italy), are used to produce Coherent Transition Radiation in the terahertz (THz) range. This paper reports on the main features of this THz source, which have a spectral coverage up to 5 THz, a pulse duration down to 100 fs, and an energy per pulse on the order of tens of μJ. These figures of merits open the possibility to apply this source for nonlinear and THz pump-probe experiments in Solid-State Physics and material science. View Full-Text
Keywords: terahertz; terahertz source; electron beams; ultrashort pulses terahertz; terahertz source; electron beams; ultrashort pulses
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Giorgianni, F.; Anania, M.P.; Bellaveglia, M.; Biagioni, A.; Chiadroni, E.; Cianchi, A.; Daniele, M.; Del Franco, M.; Di Giovenale, D.; Di Pirro, G.; Ferrario, M.; Lupi, S.; Mostacci, A.; Petrarca, M.; Pioli, S.; Pompili, R.; Shpakov, V.; Vaccarezza, C.; Villa, F. Tailoring of Highly Intense THz Radiation Through High Brightness Electron Beams Longitudinal Manipulation. Appl. Sci. 2016, 6, 56.

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