Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications
Beatriz, S.-P.; Luis, N.; Leonor, C.; Laura, M.; Elena, M.; Yolanda, F.-N. Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications. Materials 2016, 9, 109. https://doi.org/10.3390/ma9020109
Beatriz S-P, Luis N, Leonor C, Laura M, Elena M, Yolanda F-N. Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications. Materials. 2016; 9(2):109. https://doi.org/10.3390/ma9020109
Chicago/Turabian StyleBeatriz, Suárez-Peña; Luis, Negral; Leonor, Castrillón; Laura, Megido; Elena, Marañón; Yolanda, Fernández-Nava. 2016. "Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications" Materials 9, no. 2: 109. https://doi.org/10.3390/ma9020109